Part Number: ADS6245
Hi,
Two questions about test patterns:
- I'm trying to align all four lvds data channels using two test patterns (all zeros, then all ones), hoping that the change will occur at the same sample (and create a delay in the design if not). The problem is that sometime the change is not "smooth" - an unexpected value is sampled for one (parallel) clock cycle between to two patterns, ruining the whole alignment concept described. Is that a known behaviour?
- Considering alternatives - I'm not sure how to use the toggle pattern. Toggling between 0101... to 1010... every clock can only determine the existence (or absence) of a delay between channels, but not which one is late. is that correct?
Thank you.