DLP NIR Scan Nano

Dona Joy

Hi ,

I am using DLP NIR Scan Nano device with 2.1.0 version software GUI. I am using this to measure a solid material. I am facing a issue with the measurements. Even though i am not changing the position of the sample solid, every time i am getting a different spectrum (difference across y axis). What is the reason for this difference ?? I was expecting a overlapping spectrum since i didnt change the sample and device position. Is this related to calibration of the device?? Before starting measurements is it require to calibrate the device?? How do i get a perfect overlapping spectrum spectrum for solids using this DLP NIR scan Nano device. Kindly help me out with the answers.

Thanks in advance

over 4 years ago

0 Philippe Dollo over 4 years ago

TI__Mastermind 28005 points

Dona,

Welcome to the E2E forums and thank you for your interest in our DLP technology.

What type of material are you trying to measure? each NIRscan Nano EVM comes factory calibrated, and it's usually a good idea to keep the calibration and not try to recalibrate it yourself (the factory calibration cannot be recovered).

What does your spectrum look like?

Regards,

Philippe Dollo

0 Hirak Biswas over 4 years ago in reply to Philippe Dollo

TI__Genius 10925 points

Hi Dona,

How much of a variation (percentage) do you notice? Could you please provide us the scan data files?

Thanks & Regards,
Hirak.

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