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Hello, I currently have the DLP NIRscan Nano in my lab and want to run some sample tests with it.
- What is recommended as the most simple and straight forward food item to scan?
- Does TI have an available database with reference graphs/scans of items that they've tested before? I would like to have a reference to use in order to compare my obtained results.
Hi Deema,
The NIRscan Nano EVM has a sampling module which is designed for direct contact with the sample (see section 1.2.1: Optical Engine of the NIRscan Nano User's Guide). Therefore, uniform flat samples typically work the best. For samples which could be messy (powders, cheeses, etc.), the sample can be placed in a plastic bag to keep the sample from contaminating the electronics and optics of the EVM. In this case, you can also take a reference with the reference material in the same plastic bag in order to remove the absorbance of the thin plastic from the computed absorbance of the sample.
TI has not have a full database, but we have published some example scans in the test data available on the TI Design page for this module. We have focussed on bringing this spectroscopy tool to the market and are excited to see others develop their own chemometric models, databases, and analytics.
Hi Hamed,
In absorbance spectroscopy, two intensity spectrums are used to generate the absorbance spectrum:
absorbance = -log10(sample/reference)
This is done so that the instruments do not have to be radiometrically calibrated in order to measure material absorbance. This also allows changes in lamp intensity or large environmental changes inducing absorbance from water vapor, for instance, to be accounted for by simply repeating the reference scan. Therefore, the computed absorbance spectrum will vary based not only on the sample spectrum, but also the reference spectrum.
Typically, the standard used for the reference is a diffuse, spectrally neutral reflector like Spectralon. This allows the absorbance spectrum to describe only the sample, since the reference is known to reflect all wavelengths being measured at an equal amount.
In the NIRscan Nano version 1.1 GUI, a feature has been added which allows you to use a factory stored reference instead of measuring one yourself. This is convenient for simple use cases and is the same method used by the iOS app developed by KST. For stringent applications which are very sensitive to small changes in the absorbance spectrum, taking a new reference scan soon before the sample is scanned can reduce absorbance measurement variability. For more information on this feature, see section 3.1.1 of the User's Guide.
Hi Eric,
Thanks for your response.
I have the NIRscan Nano Version 1.1GUI installed. In the User guide [section 3.1.1] you refer to, it notes that the DLP NIRscan NON comes with two pre-loaded scan configurations from the factory "Column 1" and "Hadamard 1". The only setting that I have which is preconfigured is "Scan Config 1". How do I correct for this? The spectral range and digital resolution all match the specifications in the User Guide.
I'm wondering if I should purchase the reflector Sepctralon you referred to. And also, under "utilities" there is a setting to "update the factory reference calibration data" would it be useful to click "scan" in order to restore factory settings and set up the reference ?
Hamed,
Can you confirm the version of the "Tiva SW version" shown in the info page?
It sounds like perhaps you have a previous version of the firmware installed on your Nano. If the unit came with firmware version prior to 1.1.8, the default configuration will be a single config named "Scan Config 1". If the unit came with firmware version 1.1.8, it should have two default configurations named "Column 1" and "Hadamard 1". You can also define your own scan configurations as described in the User's Guide.
For a walkthrough on upgrading the Tiva firmware if indeed your unit has an older version, see this thread:
e2e.ti.com/.../455187
The 'Update the factory reference calibration data' section in the utility page of the GUI allows you to take a new scan with a reference placed at the sampling window and replace the stored reference in the NIRscan Nano. So to do this procedure, you would need to have a piece of reference material. This stored reference is used as the reference when you take a scan and select 'Factory' in the 'Scan Reference Select' section.
For general purpose use, the 99% reflective white samples are what is used. They are also available from other sources like Edmund Optics and others.
Some people use the darker grey standards as a reference when scanning very absorbent materials or to verify instrument linearity, but these applications are more rare. The color references are used to validate color measurement of instruments in the visible region, so they are not applicable in the NIR region of the NIRscan Nano EVM (900-1700nm) or the spectrum which the DLP2010NIR DMD can support with other optical designs (700-2500nm).
Hamed,
Sorry if I missed that you had already tried with the factory reference. That does indeed sound like something is not right.
If you wouldn't mind, I'd like to take a look at the CSV output from some of the scans to try and diagnose the issue. I have sent you a friend invitation so we can do this offline from the forum if you'd prefer and then we can report back what the resolution was. Otherwise, you can attach the CSV files from a couple of scans here and I can take a look.