Hi expert,
Customer used SN65LVCP114 with QFSP and report some failures with abnormal eye diagram are detected while running 15mins into the Burn-In test (45±5C); fall-out rate 4/37.
They did IC swap test and found out the symptom is followed the chip. Below are additional notes for your reference. Would you please have a look and advise what might be possible causes and how to resolve it?
Failed unit:
Just use lane1 data to be our reference.
100G dummy load: eye U+D = 300mV
40G dummy load: eye U+D = 244mV
Good unit:
Just use lane1 data to be our reference.
100G dummy load: eye U+D = 313mV
40G dummy load: eye U+D = 325mV
NAPANOOK Saturation port 1 RX fail.pdf
Thanks,
Allan
