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SN65HVD1782: Bimetallic wirebonding to IC die

Part Number: SN65HVD1782

Tool/software:

I had a risk concern for purple plague corrosion come up for SN65HVD1782QDRQ1 and other automotive ICs. The Material declaration for these parts includes the use of Au wire bonds and die metallization materials as TiW, Al, CU alloy. 

Question: Regarding the specific alloy composition of the bond wire and die surfaces, are there any mitigation towards Bimetallic wirebonding to IC die involving Au and Al? Is there any construction related processes, such as low heat bonding, to prevent this issue in your products?