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Original question:

SN65HVD3083E: IC destruction when noise enters the input/output terminals (A, B, Z, Y)

SN65HVD3083E: IC destruction when noise enters the input/output terminals (A, B, Z, Y)

Dice-K
Mastermind 6530 points
Part Number: SN65HVD3083E

Hello Adrian,
Thank you for your reply. And I'm sorry for my late reply.

If possible, please let me know the device name and the test result of DE pin.
(If the test result can be applied to SN65HVD3083E.)

If the test result cannot be applied to SN65HVD3083E, please reply me that the result is meaningless.

Best regards,
Dice-K

  • 0
    TI__Guru 62910 points
    Hello Dice-K,

    I discussed this issue with Adrian last month. To clarify on his answer, to our knowledge we unfortunately have not conducted any transient immunity tests on the SN65HVD3083E when the DE pin was held in the high state. This is something that is probably best evaluated in an actual application. Please let us know if we can provide further information, though.

    Regards,
    Max