TPD4E02B04: About VRWM and VBRF pin

Masazumi Ishii

Genius 3945 points

Part Number: TPD4E02B04

Hello.

I have a question about TPD4E02B04.

Q1
What causes VBRF to vary?
For example, if temperature, do you have (temperature-VBRF characteristics) data?

Q2.
Will the device be destroyed if a voltage higher than VRWM and lower than VBRF is applied for a long time?

Q3
Will the device be destroyed if a voltage exceeding VBRF is applied for a long time?
In case of destruction, please teach me how to calculate failure mode and life.

Q4
USB Type-C: When using TPD4E02B04 for Signal Range on CC, SBU, and DP / DM Lines, please tell me the problem.

Thank you.

over 7 years ago

0 Cameron Phillips over 7 years ago

TI__Genius 12410 points

Hello,
1) It is temperature and process. However we do not publish that data. However I can give you a typical IV curve across temp if you would like

2) No the device will not be destroyed as you will be putting less than 1mA through the part. However this is normally higher leakage than acceptable for most applications normal use case.

3)This is an ESD diode and is not meant to suppress DC events. If you are talking about applying the transients it is rated for in excess of what the datasheet has then the device will most often fail short until it takes too much power and opens up.

4) The CC lines can swing up to 5V so the leakage through the device will be unacceptable. For the DP and DN lines there is not issue with using this device.