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DS90UH929-Q1: The test of SAE J1752-x

Genius 4905 points

Part Number: DS90UH929-Q1

Hi, E2E members

Do you have test data SAE J1752-1, 2, 3 against IC or EVM?
The customer ask it to me. They want to confirm the data for DS90UH929.
If you test it, could you please provide the data?

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1) SAE J1752-1:Electromagnetic compatibility measurement procedures for integrated circuits
- integrated circuit EMC measurement procedures, general and definitions - Mar97

(2) SAE J1752-2: Electromagnetic compatibility measurement procedures for integrated circuits
- integrated circuit radiated emissions diagnostic procedure 1MHz to 1000MHz, Magnetic Field
- loop probe - Mar95

(3) SAE J1752-3: Electromagnetic compatibility measurement procedures for integrated circuits
- integrated circuit radiated emissions diagnostic procedure 150kHz to 1000MHz, TEM Cell-Mar95
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Regards,
Nao