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DAC121S101QML-SP: SEE Report

Matth. B.
Expert 1145 points
Part Number: DAC121S101QML-SP

Hi,

I have some questons regarding of the SEE test reports (SNAA157 and SNAA155) made on the DAC121S101QML-SP.

- It was not noted what is the date code of the tested DAC. Is it possible to have it?

- In order to use the tests results, I need to know if there was a die revision of a wafer change since they were performed?

Thanks

Matthieu Baque

  • 0
    TI__Genius 17125 points

    Hello Mathieu

    The datecode indicates when the material was assembled and does not give you the information you need to know.

    What is important is that the SEL testing was done on the first production space grade lot we manufactured and there have been no changes to the design, process, manufacturing, wafer fab or die since that time.

    Let me know if you have any other questions, or could you mark answer verified?

    Kirby