TMS570LS3137: Radiation Test Data establishing Radiation induced FITs for Hercules FMEDA LS31x_LS21x_v1.3

David Schenck

Part Number: TMS570LS3137

Hi,

The Hercules FMEDA LS31x_LS21x_v1.3 spreadsheet provides estimates of the failure rates of different parts of the processor.

What test reports do you have that determine the transient failure rates as a function of the Flux Factor coeff!

Regards,

David

over 4 years ago

0 QJ Wang over 4 years ago

TI__Guru**** 198676 points

Hi David,

All of the estimations are based on measurements taken according to JEDEC JESD89A, Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray Induced Soft Errors in Semiconductor Devices, with assumption of neutron flux = 1.

https://www.jedec.org/document_search/field_committees/18?search_api_views_fulltext=JESD89A

0 David Schenck over 4 years ago in reply to QJ Wang

Prodigy 125 points

The Hercules FMEDA LS31x_LS21x_v1.3 spreadsheet provides a sheet for Safety Mechanism Tailoring.

Is a test report available that shows the Neutron or Proton Sensitivity of the 65nm Flash in the TMS570LS3137EP

Is the Flash implemented with a mult-level floating gate approach manufactured in a 65nm technology?

0 QJ Wang over 4 years ago in reply to David Schenck

TI__Guru**** 198676 points

Hi David,

The F021 flash technology rather than each device was tested for alpha and neutrons. The alpha and neutron susceptibility is about 1000 FIT/Megabit. I don't have the test reports. I am not sure if the F021 is implemented with a multi-level floating gate or not.

The device is in a 65nm technology.

Arm-based microcontrollers

Arm-based microcontrollers forum

TMS570LS3137: Radiation Test Data establishing Radiation induced FITs for Hercules FMEDA LS31x_LS21x_v1.3