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Original question:

AM2634: 1149.1 Boundary Scan Test

AM2634: AM2634AKNFHMZCZRQ1: 1149.1 Boundary Scan test

Jeong Kim
Prodigy 60 points
Part Number: AM2634

Add more questions about AM2634 Boundary Scan test as the link below.

https://e2e.ti.com/support/microcontrollers/arm-based-microcontrollers-group/arm-based-microcontrollers/f/arm-based-microcontrollers-forum/1201670/am2634-1149-1-boundary-scan-test/4535058?focus=true

I have tried the setting for the boot mode as below, but the device doesn't work with the Boundary Scan test.

With the information that you have sent, you will not be able to do boundary scan since the bootmode you have configured is the QSPI boot mode. In order to do BSDL operations, use bootmode 1001 where SOP3 and SOP0 are high and SOP2 and SOP1 are low. 

Could you please give me more suggestions or advices?

Regards,

Jeong

  • 0
    TI__Expert 6835 points

    Hello Jeong, 

    Can you elaborate on how the device does not work with the Boundary Scan test? 

    Also, could you try using the attached file and see if you still experience issues?

    Regards,

    Erik

    https://e2e.ti.com/cfs-file/__key/communityserver-discussions-components-files/908/AM263.bsdl

  • 0 in reply to Erik Friedel
    Prodigy 60 points

    Hi Erik,

    The BSDL you provided seems has an error in IDCODE_REGISTER section, below is the detail of the error.

    in BSDL file:

    attribute IDCODE_REGISTER of AM263 : entity is
    -- "0000" & -- Version Number
    -- "1011101101111011" & -- Part Number
    -- "00000010111" & -- Manufacturer ID
    -- "1";
    "0000" & -- Version Number
    "0000000000000000" & -- Part Number
    "00000000000" & -- Manufacturer ID
    "0";    => It should be "1" based on the 1149.1 JTAG format.

    The failure of the Boundary Scan test for AM2634AKNFHMZCZRQ1 occurs at "IEEE Std 1149.1 Integrity test". The device doesn't seem to be in Boundary Scan Mode after "Test-Logic-Reset" mode. The output of TDO is always stuck high state, no change at all even the Bootstrap pins(SOP3-0) set to "1001"

    There is QSPI FLASH component, but it is blank part, no pre-programmed. That means that the board is not booting up using QSPI Flash component. Also I tried to set the Bootstrap pins for Boundary Scan mode with "1001" as you recommaned.

    Any helps, it would be great.

    Thanks,

  • 0 in reply to Jeong Kim
    TI__Expert 6835 points

    Hello Jeong,

    The file that I sent has been proven to work under the following circumstances:

    • Lauterbach tools with the AM263x Control Card
    • Version of the device did not have the manufacturer ID burned in 
    • bootmode "1001"

    Can you provide a block diagram or schematic to show how the bootmode is being set?

    Can you provide a block diagram or schematic to show the JTAG connections?

    Can you provide the tools that you are using with the BSDL file? 

    Here are a few follow up debug questions:

    • Have you ensured that you have done a clean power cycle after configuring the SOP pins to 1001?
    • Have you ensured that there is a good connection between the tool and the board?
    • Do you have a different tool to ensure that the failure is not unique to the tool?

    Regards,

    Erik

  • 0 in reply to Erik Friedel
    Prodigy 60 points

    Hello Erik,

    Can Lauterbach tool run a full JTAG 1149.1 Boundary Scan test for the component?

    Please correct me if I have wrong information. As far as I know that Lauterbach tool can do the Kernel & application debugging over the JTAG interface and it may be a different way than the standard 1149.1 JTAG Boundary scan testing.  Is that correct?

    Here are the answer for your questions.

    • Have you ensured that you have done a clean power cycle after configuring the SOP pins to 1001?
    • 1. The Bootstrap pins are configured to "1001" using GP-Relay before powering up the board. The test failed at the BSCAN Integrity test(Infrastructure test)
    •  2. Recycle the power of the board after set the bootmode to "1001" , but the result was the same.

    • Do you have a different tool to ensure that the failure is not unique to the tool?

      The tools we are using are Keysight X1149 Boundary Scan Analyzer and Keysight 3070 ICT tester and the Boundary Scan test of the device doesn't work on both test tools.


    As I mentioned that the SPI Flash on the schematic is not pre-programmed, it is a blank part on the board. 

    Thanks,

  • +1 in reply to Jeong Kim
    TI__Expert 6835 points

    Hello Jeong,

    Jeong Kim said:
    Please correct me if I have wrong information. As far as I know that Lauterbach tool can do the Kernel & application debugging over the JTAG interface and it may be a different way than the standard 1149.1 JTAG Boundary scan testing.  Is that correct?

    Lauterbach uses the standard 1149.1 JTAG Boundary scan. For more information refer to: https://www2.lauterbach.com/pdf/boundary_scan.pdf

    The .bsdl was confirmed to work with the Lauterbach tool. Please refer to the vendor for further support on using the BSDL file. 

    Regards,

    Erik