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TMS320F28388D: Controller peripherial configuration settings clock

NAGESH RK
Expert 2260 points

Part Number: TMS320F28388D
Other Parts Discussed in Thread: STRIKE

hello, 

I am using F28388D controller for aerospace application.  I have a question on Singe Event Upset and MBU, i am aware of the ECC Module present .

To configure any peripheral it will be under EALLOW and EDIS, my question is for example SPI peripherial clock though its configured correctly during initialization can its values be modified due to SEU.

thanks,

Nagesh

  • 0
    TI__Guru* 82670 points

    Nagesh,

    Please note that today, July 5th, is a US holiday.  You should expect a reply no later than end of day tomm, July 6th.  Appreciate your patience.

    Best,

    Matthew 

  • 0
    TI__Guru 55700 points

    Nagesh,

    If my understanding is right, your question is can I re-configure SPICLK (baud rate) on any event. If so, the answer is yes.

    Regards,

    Manoj

  • 0 in reply to Manoj Santha Mohan
    Expert 2260 points

    Hi Manoj, 

    No, my question was due to radiations can the SPI clk configurations get modified when code is executing.

    thanks,

    Nagesh

  • 0 in reply to NAGESH RK
    TI__Guru 55700 points

    Nagesh,

    I need to check with my colleagues on the effect of radiation on register settings.  What kind of radition profile are we talking about?

    Regards,

    Manoj

  • 0 in reply to Manoj Santha Mohan
    TI__Guru* 82670 points

    Nagesh,

    I'm looking to see what simulation data we have/can share, this will be generic in terms of FIT rate for any logic on the device, etc.  I'll need a few days here as there are some folks that are OOO until next week.  I'll also look into if there is any NDA needed to share this data in parallel.

    In terms of protection, the EALLOW/EDIS would only help if there was a CPU instruction mis-decode caused by a radiation event.  If the radiation strike was local to the SPI clock register control/divider this wouldn't help.

    Another option is the ability to detect if this does happen, in this case we could use the eCAP module to sample the SPICLK signal and this would detect if there was a change at some point.  This would be implemented in SW, but this is another method to prevent a SEU event from causing issues.

    Best,

    Matthew

  • 0 in reply to MatthewPate
    TI__Guru* 82670 points

    Nagesh,

    Appreciate your patience here.  I will refer you to this application report which gives instructions on how to request our C2000 Safety Package.  Included in this package is a FIT rate estimator that will allow you to input the Flux Factor to change the altitude for your application and generate the expected FIT from radiation effects.  Currently the F2838x device is still WIP, however, the F2837x is included which should allow you to get a close approximation(F2837x only lacks the CM of the F2838x and associated memory)

    I will also mention that all the flash as well as some of the SRAM has ECC logic, which will correct single bit faults and detect 2 bit faults for every 128 bits.  This will be mentioned in the safety guide, and should be comprehended in the estimator.

    Best,

    Matthew