Other Parts Discussed in Thread: MSP-EXP432E401Y, , MSP432E401Y
Dear team,
My customer is using Onboard XDS110(MSP-EXP432E401Y) to debug their custom TMS320F28027 board. But the Onboard XDS110 CAN NOT debug their custom TMS320F28027 board.
The F28027 board works well because the independent XDS100V2 and XDS110 emulators can debug it.
CCS Test Connection Log [Start: Texas Instruments XDS110 USB Debug Probe] Execute the command: %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity [Result] -----[Print the board config pathname(s)]------------------------------------ C:\Users\ADMINI~1\AppData\Local\TEXASI~1\ CCS\ccs1011\0\0\BrdDat\testBoard.dat -----[Print the reset-command software log-file]----------------------------- This utility has selected a 100- or 510-class product. This utility will load the adapter 'jioxds110.dll'. The library build date was 'May 7 2020'. The library build time was '21:10:18'. The library package version is '9.2.0.00002'. The library component version is '35.35.0.0'. The controller does not use a programmable FPGA. The controller has a version number of '5' (0x00000005). The controller has an insertion length of '0' (0x00000000). This utility will attempt to reset the controller. This utility has successfully reset the controller. -----[Print the reset-command hardware log-file]----------------------------- The scan-path will be reset by toggling the JTAG TRST signal. The controller is the XDS110 with USB interface. The link from controller to target is direct (without cable). The software is configured for XDS110 features. The controller cannot monitor the value on the EMU[0] pin. The controller cannot monitor the value on the EMU[1] pin. The controller cannot control the timing on output pins. The controller cannot control the timing on input pins. The scan-path link-delay has been set to exactly '0' (0x0000). -----[An error has occurred and this utility has aborted]-------------------- This error is generated by TI's USCIF driver or utilities. The value is '-233' (0xffffff17). The title is 'SC_ERR_PATH_BROKEN'. The explanation is: The JTAG IR and DR scan-paths cannot circulate bits, they may be broken. An attempt to scan the JTAG scan-path has failed. The target's JTAG scan-path appears to be broken with a stuck-at-ones or stuck-at-zero fault. [End: Texas Instruments XDS110 USB Debug Probe]
Customers have tried to lower the TCLK frequency to 100kHz, 500kHz, 1MHz, 2MHz, 3MHz, and the error message remains unchanged.
They CAN use the same way to debug 28035 board.
Test waveform when use independent XDS110 emulators:

Test waveform when use onboard XDS110 emulators:

Please help to check this issue.

