Hi Diaa,

Due to Holiday break, most of the subject matter expert are out of office, and please expect response by Jan 6th. Sincere apology for inconvenience.

Hello Diaa, Probing D/A pins would need HV differential probe or an isolated scope as the power stage is not isolated. One way to check the sanity of the communication would be to look at device manager of your PC and check if the USB debug probe is being detected. 

Hi Navaneeth,

The main board is being detected I believe, as you can see below from the device manager.

I also ran the SDS100serial.exe tool:

C:\TI\ccs1020\ccs\ccs_base\common\uscif>xds100serial.exe
Scanning for XDS100 emulators...

VID/PID Type Serial # Description
0403/a6d0 XDS100v1/v2 TI3GQTWK Texas Instruments XDS100+RS232 V1.0

Regarding the D/A pins, I was referring to J14, which are low voltage signals I believe and don't require a differential probe:

Thank you

Diaa

Diaa, This design has an non isolated power stage - which means the GND of this hardware would be different scope ground. And hence cant be connected together unless the scope power supply is isolated. Its difficult to specify which IC would have gone wrong. May be check the signals of digital isolators (U5/U6) when you perform "test connection" through CCS. Again this would need isolated scope or HV differential probe. Hope you have changed the device in target configuration file to 28335.

Hi Navaneeth,

I collected a few traces of the JTAG signals TCK, TDI, TDO and TRSTn. The measurements were made at the control card pins.

I can see signals on the oscilloscope using the "Test Connection" in CCS but the test still fails.

Please see below:

TCK

TDI

TDO

TRSTn

CCS configuration

Test Connection Output

[Start: Texas Instruments XDS100v1 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]

-----[Print the board config pathname(s)]------------------------------------

C:\Users\younesd\AppData\Local\TEXASI~1\
CCS\ccs1020\0\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Jan 1 2021'.
The library build time was '11:25:57'.
The library package version is '9.3.0.00032'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

There is no hardware for programming the JTAG TCLK frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

There is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 64 32-bit words.

The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.

The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG IR Integrity scan-test has failed.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG DR Integrity scan-test has failed.

[End: Texas Instruments XDS100v1 USB Debug Probe_0]

I noticed after test connection that failure rate is 83.3 percent as highlighted in red above.

Thanks for your help

Diaa

Diaa, JTAG signals are expected to swing between 0 and 3.3v. In the scope plot, the signals are 1v or less. Not sure if its due to probe attenuation. Does LD1 LED glow on the control card? Also check if SW2 is changed from default position (boot from flash). By any chance if you have TMDSPREX28335, do check the control card connectivity separately.

Hi Navaneeth,

I am using a differential probe that I got recently so that's why the voltages are attenuated. I believe signals are being attenuated 5 times.

Yes, LED 1 is glowing green.

I checked the switches, SW1 is in the OFF positions and SW2 are all in the ON position. Please see photos below.

Unfortunately the TMDSHVMTRPFCKIT is the only kit I have and I don't own an TMDSPREX28335 to check if I can flash the 28335 card.

LD1

SW1 and SW2

Thanks

Diaa

Hi Diaa,

Might the XDS100v1 not be compatibles with x35 MCU class? We have to use XDS110 probe with TMS32028049c MCU class as XDS100 does not support two wire signaling emulation used during flashing firmware. If you have LaunchXL49c pad the XDS110 debug probe (ICDI) can be used externally for flashing firmware on to other MCU classes via two signal wire mode.

Perhaps Navaneeth can confirm if XDS100 will be compatible x35 MCU class.

Regards,

Hi GI,

thanks for your feedback. I have read that the control card of TMDSHVMTRPFCKIT is compatible with both 28035 and 28335, but I am not sure if programming the 28335 is any different from programming the 28035. Unfortunately, I don't have an external tool to program the the microcontroller.

Thank you

Diaa

Diaa,  Please refer to the Hardware Reference Guide for the switch settings and try again.

I tried the boot from SCI option but I am still not able to flash software. The "test connection" still fails as before.

I tried with MainJ9 removed as well as MainJ9 populated but still have the same issue, But I think J9 should be populated in order to flash the software.

One thing I noticed with the boot from SCI option is that one of the two red LED on the main board (shown in the picture below - the upper LED) turned off.

Thanks

Diaa

Unfortunately, the issue is not solved yet. I am not able to flash software. Any more suggestions ?

Thanks

Diaa

You may have to replace some ICs in the JTAG path on board, which may include FTDI and reprogramming it. You are better off to use an iso control card that has isolated JTAG built in it.

www.ti.com/.../TMDSCNCD28035ISO

Hi Ramesh,

why do you think it's better to use the F28035 as it is isolated?

How is it different from F28335 ? does is also have an isolated JTAG ?

And which ICs would I need to change? The scope traces I posted showed that the signals are being generated from the FTDI chip.

Thanks

Diaa

The PC cannot be in the GND as control card / EVM kit. This kit is more than 10 years old and has the JTAG built on board, which we dont do in the recent ones. If the JTAG ckt is damaged, it will have to be replaced. Cant pin point remotely which IC could have damaged. 

You had earlier used F28035 control card, probably the non isolated version. I am suggesting to use the isolated version of the same.

Thanks Ramesh,

If I use an isolated card, would the the JTAG on the kit be bypassed and so the JTAG on the control card is used ?

So, in other words, if I assume the JTAG on the kit is damaged, would the JTAG on the isolated card be used to program the card?

Thanks

Diaa

Yes

Hi Ramesh,

We got the 28035 isolated board and I connected the the laptop directly to the card USB, unpopulated [Main]J9 and populated [M3]J5 as described in this post TMDSHVMTRPFCKIT: Connection failed with PC - C2000 microcontrollers forum - C2000︎ microcontrollers - TI E2E support forums

I can see that both LEDs LD1 and LD4 (the one close to the mini-usb) are on.

However, I am seeing the same issue as before. I believe there's communication with the card but the software is not being getting flashed.

Please see log below when I try to test connection:

[Start: Texas Instruments XDS100v1 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Jan 1 2021'.
The library build time was '11:25:57'.
The library package version is '9.3.0.00032'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

There is no hardware for programming the JTAG TCLK frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

There is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 64 32-bit words.

The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-zero.

The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-zero.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG IR Integrity scan-test has failed.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Test 1 Word 0: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 1: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 2: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 3: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 4: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 5: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 6: scanned out 0xFFFFFFFF and scanned in 0x00000000.
Test 1 Word 7: scanned out 0xFFFFFFFF and scanned in 0x00000000.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 1, skipped: 0, failed: 1
Do a test using 0x00000000.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG DR Integrity scan-test has failed.

[End: Texas Instruments XDS100v1 USB Debug Probe_0]

I also tried flashing from embedded coder directly but I got the following errors:

*** Starting debug session...

*** Debug Session Name: Texas Instruments XDS100v1 USB Emulator_0/C28xx

*** Board Name: Texas Instruments XDS100v1 USB Emulator_0

*** CPU Name: C28xx

*** Connecting to target... SEVERE: C28xx: Error connecting to the target: (Error -1015 @ 0x0) Device is not responding to the request. Device may be locked, or the debug probe connection may be unreliable. Unlock the device if possible (e.g. use wait in reset mode, and power-cycle the board). If error persists, confirm configuration and/or try more reliable JTAG settings (e.g. lower TCLK). (Emulation package 9.3.0.00032)

Could you please advise.

Thank you

Diaa