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TMS320F280041: CC1312R MCUs: "Average Failure Rate" over the useful lifetime (10 years, TJ = 105C)?

Part Number: TMS320F280041
Other Parts Discussed in Thread: CC1312R

Team,

Customer is trying to estimate the device lifetime for his use case (ie his specific "mission profile").

The below app note indicates for our EP (MCUs, procerssors) devices:
"The current generation of TI industrial grade EP product is designed to support a useful lifetime of 10 year operating at 105°C junction temperature (TJ)"

     App npte: Calculating Useful Lifetimes of Embedded Processors - SPRABX4
     App Note: Calculating FIT for a Mission Profile - SPRABY3

Now looking at the The below TI.COM page that gives the "Failure rate" terminology:
https://www.ti.com/support-quality/reliability/reliability-terminology.html#

Question:
For some devices like CC1312R, F280041 MCUs what is the typical "Average Failure Rate (λavg)" for the lifetime given above (ie t = 10 years at 105C TJ)?
and for which sample size?

Thanks in advance,

A