Hi experts,
My customer did high/low-temperature test on their control board based on two F28377S (More specifically it is F28377SZWTQ YFC-09A26SW). And they got following results:
The horizontal axis represents test index (or time frame). The left vertical-axis represents voltage (after analog front-end circuit and SW post-processing, and 4V represents that the ADC channel input is 0.96 V). And the right vertical-axis represents temperature. On the other hand, the ADC reference is 3V.
As you can see, the ADC value varies a lot when the temperature changes to 75°C (about 98 ADC LSB). Strangely, two chips (with same part number) has different variation. But they are in a same board and under same temperature condition. And I don't think it is caused by different CPU/Peripherals load, please correct me if it is.
On the other hand, the chip boots from Flash mode, so Device_cal function is executed in Boot firmware.
So what I and my customer want to know is why this phenomenon happened and how to compensate this variation more than calling Device_cal? Thanks for your help.
Best Regards,
Will