TMS320F28035: Programming issues (TMS320F28035 + XDS200 USB Debug Probe)

Hi there.

We want to test the TIDA-01280 board, and for that purpose we bought the XDS200 USB Debug Probe. I am compiling one of the examples projects for this MCU but I am struggling with the XDS200, I can't get it to work.

I am not sure if the Target configs setting are the right ones and I don't see any straight forward information on how to set it right for this MCU.

The following is the project I am using for testing:

I am getting the following errors:

-----[An error has occurred and this utility has aborted]--------------------This error is generated by TI's USCIF driver or utilities.The value is '-230' (0xffffff1a).The title is 'SC_ERR_PATH_MEASURE'.The explanation is:The measured lengths of the JTAG IR and DR scan-paths are invalid.This indicates that an error exists in the link-delay or scan-path.

or

-----[An error has occurred and this utility has aborted]--------------------This error is generated by TI's USCIF driver or utilities.The value is '-233' (0xffffff17).The title is 'SC_ERR_PATH_BROKEN'.The explanation is:The JTAG IR and DR scan-paths cannot circulate bits, they may be broken.An attempt to scan the JTAG scan-path has failed.The target's JTAG scan-path appears to be brokenwith a stuck-at-ones or stuck-at-zero fault.[End: Texas Instruments XDS2xx USB Onboard Debug Probe_0]

Could you help me to figure it out how to program the MCU successfully?

Regards,

Wilson.