TMS320F28379D: XDS110 Debug Probe

Hi,

Are you able to see the XDS110 debug probe in your Windows Device Manager? Have you tried switching the cable with another known good USB cable? 

Best Regards,

Ben Collier

XDS110 is detected in Port link of Windows Device manager not in USB controller 

i am getting like this

Hi, 

Could you please try following the instructions on this webpage for manually updating the firmware?

https://software-dl.ti.com/ccs/esd/documents/xdsdebugprobes/emu_xds110.html

Best Regards,

Ben Collier

I have updated the driver. But still this error is coming while doing Test connection. 

This error is generated by TI's USCIF driver or utilities.

The value is '-233' (0xffffff17).
The title is 'SC_ERR_PATH_BROKEN'.

The explanation is:
The JTAG IR and DR scan-paths cannot circulate bits, they may be broken.
An attempt to scan the JTAG scan-path has failed.
The target's JTAG scan-path appears to be broken
with a stuck-at-ones or stuck-at-zero fault.

Hi,

This new error message indicates that there might be something wrong with the connection to the target board. Is the target board a custom design? If so, are you able to share the schematic? I have sent you a friend request so that we can send each other private messages, in case you would like to share the schematic offline.

Best Regards,

Ben Collier

Ok, I am glad to hear that this issue is resolved. 

This is the schematic of JTAG.The same error occurred when I used xds 110 Debug Probe to connect jtag on the PCB.

Could you please take a look at it for me？

Hi Ian,

Have you tried to increase the value of the pull-down resistor R29 on TRST? You could also remove it while you are using the JTAG debug probe. This pulldown resistor is recommended mostly to provide protection to the device during stand-alone mode. 

All of the connections look good in the schematic. 

Best Regards,

Ben Collier