Part Number: TMS320F28386D
Functional Safety Manual for TMS320F2838x Real-Time Microcontrollers
Show the usage of each safety features, take PIE3 for example, from my understanding, it shall be Test for diagnostic.
But TI classify it as diagnostic.

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Part Number: TMS320F28386D
Functional Safety Manual for TMS320F2838x Real-Time Microcontrollers
Show the usage of each safety features, take PIE3 for example, from my understanding, it shall be Test for diagnostic.
But TI classify it as diagnostic.

If you're testing regular PIE operation (like forcing an interrupt at the peripheral level and ensuring it is serviced correctly) I don't see what would make that a test for diagnostic. If you're doing a functional test of the PIE double SRAM comparison, that is a test for diagnostic, but that's what PIE6 is describing, not PIE3.
Whitney
Right. To use PIE6 I mentioned above as an example, there is a way to purposefully create a mismatch between the regular vector table and the duplicate. You can then force a vector fetch from that location where you created the mismatch and the confirm that the correct error handler routine got called as a result.
Whitney