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TMS320F280045: XTAL Oscillator failure

Part Number: TMS320F280045

We are getting closer to the root problem. We found out that it was an NMI (more specifically an NMI of the PLL) that was causing this strange behavior from our last post (TMS320F280045: Incorrect ISR jump address).

Apparently, something is going wrong with our oscillator. Unfortunately, I haven't found out yet, if it is the DSP or the crystal that is causing this error. Can you see from the attached trigger picture what could cause this error? On the picture you can see that the crystal comes to a complete stop within 300us after normal operation.

We have chosen the crystal according to your selection guide and never had any problems until our last post.

 

  • Christian,

    Can you give some additional background on the failure;

    1)Is this seen on a single device, or across multiple devices?

    2)Any temperature dependence?

    3)Was this a time zero issue or after some time of use?(I think from your original post this happened after some time, but would like to make sure here).

    Best,

    Matthew

  • Hi Matthew,

    Thank you very much for supporting me.

    1)Is this seen on a single device, or across multiple devices?

    The error itself has occurred in several assemblies. Prozenually seen, however, only with very few.

    2)Any temperature dependence?

    We are currently running extensive climate tests. So far, no correlation between temperature nor humidity could be found.

    3)Was this a time zero issue or after some time of use?

    No, the error occurs very rarely. Sometimes very quickly after switching on (>10sec) and sometimes only after several hours or days of operation. Interestingly, in most cases this error occurs in bunches, i.e. when the error occurs, it occurs right away two or three times more. This in turn suggests a temperature dependence.

    Regards, Christian

  • Christian,

    I'm collecting some more information internally, if this is a known behavior/cause.  I'll have another response by tommorow US time.

    Best,
    Matthew

  • Christian,

    Based on the information you have given, I believe that the subset of units that show this behavior are potentially defective.  I would like to start the process of returning a sample of these units back to TI for failure analysis/confirmation of the above.  Assuming that is confirmed, TI quality team can give recommendation on mitigation etc.

    This page: https://www.ti.com/support-quality/additional-information/customer-returns.html?keyMatch=RETURNS details the procedure based on where the devices were procured.  There is slightly different flow if the devices were purchased through a Distributor vs TI directly.  In either case please reference this E2E post for any approval from TI side to begin this process.

    Let me know if you have further questions either on the issue or the return process.

    Best,

    Matthew