TMS320F28376D: DAC Electrical Characteristics

Kurumi Hasegawa

Hi team,

For the Buffered DAC Electrical Characteristics of TMS320F28376D, are below gain and offset error values identical for each pcs?

For example, assuming the offset error was 8mV for 1^st powering up cycle. Then, is it always 8mV for 2^nd/3^rd powering up cycle? Or is there a possibility that it would be 10mV or 5mV?

Best regards,

Kurumi

over 3 years ago

0 Gus Martinez over 3 years ago

TI__Mastermind 30381 points

Kurumi Hasegawa said:
For example, assuming the offset error was 8mV for 1^st powering up cycle. Then, is it always 8mV for 2^nd/3^rd powering up cycle? Or is there a possibility that it would be 10mV or 5mV?

It should not be assumed that the offset error will remain constant from power cycle to power cycle. The error could shift with aging, temperature, device-to-device, etc.

0 Kurumi Hasegawa over 3 years ago in reply to Gus Martinez

TI__Expert 7991 points

Thank you for your prompt reply.

So, even if temperature, age and device are the same, those errors shift. And we cannot calibrate those errors by device, correct?

Best regards,

Kurumi

+1 Gus Martinez over 3 years ago in reply to Kurumi Hasegawa

TI__Mastermind 30381 points

Kurumi,

You can calibrate, but ideally you would run the calibration at power-up on every device. This would account for aging and device-to-device variations. To account for temperature shifts, you would have to run the calibration periodically.

0 Kurumi Hasegawa over 3 years ago in reply to Gus Martinez

TI__Expert 7991 points

Understood, thank you!

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TMS320F28376D: DAC Electrical Characteristics