Part Number: TMS320F28377D
The sampling issues encountered during the use of TMS320F28377DZWTS are as follows:
This chip is applied in the 100kw PCS energy storage project, with 4 sets of - ADC (ADCA~ADCD) sampling configurations used to sample the voltage and current of the PCS system. Currently, it is configured as a single ended 12 bit - ADC mode, with an ADC reference power supply of 3V. The problem is that the data collected from the ADCD channel fluctuates more than the data collected from other channels, as shown in the following figure:

Based on the data, there are several suspicious directions: 1) ADC reference power supply, 2) PCB layout, and 3) software configuration application. We have conducted the following verification tests on our end:
--PCB wiring, sampling and conditioning circuit filtering parameter verification:
1) The ADC port of the chip exchanges data between ADCA3 and ADCD3, but there are still significant fluctuations in the ADCD3 channel data.
2) ADCA3, ADCB3, and ADCD3 all collect data from the input of the ADCA3 channel, but the ADCD3 channel data fluctuates greatly.
3) ADCA3, ADCB3, and ADCD3 all collect data from the input of the ADCD3 channel, but the ADCD3 channel data fluctuates greatly.
4) Increasing the filtering degree of ADCD3 channel conditioning parameters is ineffective, but the ADCD3 channel still fluctuates greatly.
--Power supply verification:
5) Using an external power supply to provide ADC front-end operational amplifier conditioning circuit power and a 3V reference power supply to read data, there are still significant fluctuations in ADCD3 channel data.
6) Adding a 3V reference power input decoupling capacitor has no effect, but there is still significant fluctuation in the ADCD3 channel.
--Software configuration verification:
7) Adjusting the sampling and holding time of the ADC converter/adjusting the conversion order of various channels inside the ADCD showed no signs of improvement, but there were still significant fluctuations in the ADCD3 channel data.
Please assist in reviewing this issue, thank you!
