TMS320F2800156-Q1: self test of flash ECC

Samuel Li

Intellectual 410 points

Part Number: TMS320F2800156-Q1
Other Parts Discussed in Thread: C2000WARE

Tool/software:

Development envirement:

MCU: TMS320F2800156-Q1

TRM: TMS320F280015x Real-Time Microcontrollers Technical Reference Manual_RevB_.pdf

CCS: 12.7

SDK: C2000Ware_5_02_00_00

example：C:\ti\c2000\C2000Ware_5_02_00_00\libraries\diagnostic\f280015x\examples\sdl_ex_flash_ecc_test

Why injecting errors into the lower 64 or upper 64 bits(128-bit data word) separately produces different result?

/BR

Samuel

over 1 year ago

0 Whitney Dewey over 1 year ago

TI__Guru 54195 points

Hi Samuel--I'm able to reproduce this and am looking into it. Will get back to you soon.

Whitney

0 Samuel Li over 1 year ago in reply to Whitney Dewey

Intellectual 410 points

Hi Whitney,

Have you made any progress？

0 Whitney Dewey over 1 year ago in reply to Samuel Li

TI__Guru 54195 points

Hi Samuel,

Thanks for your patience. I still haven't heard back from the expert I consulted. I'll ping them again.

Whitney

0 Whitney Dewey 10 months ago

TI__Guru 54195 points

Hi Samuel--Sorry for the long delay, but we did figure out that the correctable errors in this example are occurring because the address being read to trigger the error is an erased location (all 1s). If you update the TEST_FLASH_ADDR_LOW and TEST_FLASH_ADDR_HIGH values to addresses that have actual data/code programmed to them, the correctable errors will go away, and it will only generate the expected uncorrectable error caused by the mismatch between the redundant ECC blocks. We'll update the example to fix this in a future SDK release.

Whitney

C2000™︎ microcontrollers

C2000 microcontrollers forum

TMS320F2800156-Q1: self test of flash ECC