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LAUNCHXL-F28379D: Bricked Boards After Running Program From RAM

jz1354
Prodigy 50 points

Part Number: LAUNCHXL-F28379D
Other Parts Discussed in Thread: UNIFLASH, TMS320F28379D

Tool/software:

Hello,

I was debugging a couple of programs in cores 1 & 2 from RAM. I left my workstation for a bit, then came back to notice that the XDS Debug probes showed disconnected on both cores. I tried re-programming both cores, but I cannot connect to the device. I get an error 2131. The D4 led on the jtag side is on and I can see that the XDS is getting a COM port under device manager. The D1, D9, and D10 leds are on as well. I also tried programming the blinky program to core1 utilizing Uniflash, but still cannot connect. Finally, I tried the procedure of connecting a power supply to the processor side of the board described in the following post, but the board did not hit the current limit. The 2131 error has happened on another board.

https://e2e.ti.com/support/microcontrollers/c2000-microcontrollers-group/c2000/f/c2000-microcontrollers-forum/1012845/launchxl-f28379d-part-hot-and-unable-to-connect

Any other suggestions for connecting the board. I am not utilizing a CSM password.

Thanks.

  • 0
    TI__Mastermind 20901 points

    Hi,

    Do you have access to a thermal camera? This can be helpful to see if the device has been damaged and may be overheating. 

    Did you have anything connected to the LaunchPad that could, for example, supply voltage that exceeds the device's 3.3V power rail?

    Do you have access to another TMS320F28379D device you could use to replace the device? This would be a final effort

    Regards,

    Peter

  • 0 in reply to Peter Luong
    Prodigy 50 points

    Hello Peter,

    Yes, I have access to a thermal camera. The processor was showing ~31C. Sorry, I should have noted that the processor package was not getting hot. I just wanted to follow a step by step process to see if it was damaged.

    No, nothing is connected to the launchpad that exceeds the 3.3V rail.

    Yes, I have another board that I am running my programs on. No problems have been noted.

    Thank you.

  • 0 in reply to jz1354
    TI__Mastermind 20901 points

    Hi,

    31 C is about normal for the device to run at. It may also help to put the board in Wait boot mode to prevent the MCU from running any program from the flash. We've seen instances where the debugger does not have enough time to startup before the MCU initializes, which may prevent the debugger from connecting properly.

    Regards,

    Peter

  • 0 in reply to Peter Luong
    Prodigy 50 points

    Hello Peter,

    I tried placing both boards in wait mode to see if anything different happened. But, still the same behavior. Also, I utilized the test connection functionality on the target configuration menu, and I am getting failed JTAG scan-tests.

  • 0 in reply to jz1354
    TI__Mastermind 20901 points

    Hi, 

    What error are you seeing with the JTAG scan? Is it the same across both boards?

    Regards,

    Peter

  • 0 in reply to Peter Luong
    Prodigy 50 points

    C:\\********\CCS\ccs1270\0\0\BrdDat\testBoard.dat

    -----[Print the reset-command software log-file]-----------------------------

    This utility has selected a 100/110/510 class product.
    This utility will load the adapter 'jioserdesusb.dll'.
    The library build date was 'Sep 26 2024'.
    The library build time was '10:09:41'.
    The library package version is '20.0.0.3178'.
    The library component version is '35.35.0.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '4' (0x00000004).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.

    -----[Print the reset-command hardware log-file]-----------------------------

    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the FTDI FT2232 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for FTDI FT2232 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    -----[The log-file for the JTAG TCLK output generated from the PLL]----------

    There is no hardware for programming the JTAG TCLK frequency.

    -----[Measure the source and frequency of the final JTAG TCLKR input]--------

    There is no hardware for measuring the JTAG TCLK frequency.

    -----[Perform the standard path-length test on the JTAG IR and DR]-----------

    This path-length test uses blocks of 64 32-bit words.

    The test for the JTAG IR instruction path-length failed.
    The JTAG IR instruction scan-path is stuck-at-ones.

    The test for the JTAG DR bypass path-length failed.
    The JTAG DR bypass scan-path is stuck-at-ones.

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG IR Integrity scan-test has failed.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG DR Integrity scan-test has failed.

    [End: Texas Instruments XDS100v2 USB Debug Probe_0]

  • 0 in reply to jz1354
    TI__Mastermind 20901 points

    Hi,

    Thanks for the additional info. There is partial failure with the JTAG connection. This can be a result of either the C2000 part being damaged or the debugger being damaged. Unfortunately, the easiest solution would be to do A/B swapping with the components and check to understand which component specifically is damaged, then to directly replace the part

    Regards,

    Peter