TMS320F28P650DK: Software diagnostic library implementation problems

Part Number: TMS320F28P650DK

Tool/software:

Hello, 

I am implementing SDL from driverlib 5.04.00.00 to my device and facing some implementation issues.

1.
STL_CPU_REG_checkCPURegisters(): program crashes when execute loopCPUReg2Test assembly function. (I am using only CPU1). For now I have uncommented that function from assembly code. Is it a correct solution or would you suggest better one?

2. 
STL_CPU_REG_checkVCRCRegisters(): I have taken a code snipset from your example - f28p65x_test_application_cpu1 where you are calculating CRC from the following array.

float32_t faUser_crcData[STA_USER_CRC_DATA_SIZE] =
    {0.00006104, 0.00164795, 0.00762939, 0.02093506,
     0.04449463, 0.08123779, 0.13409424, 0.20599365,
     0.29962158, 0.41204834, 0.53472900, 0.65887451,
     0.77569580, 0.87640381, 0.95220947, 0.99432373};

which is stored in memory as the following string:
029A 3880 0007 3AD8 FFF6 3BF9 8001 3CAB 4000 3D36 6000 3DA6 5000
3E09 F000 3E52 6800 3E99 F800 3ED2 E400 3F08 AC00 3F28 9400 3F46
5C00 3F60 C400 3F73 8C00 3F7E

Problem is that the result of CRC calculation inside of STL_CRC_checkCRC() does not mach with any result I got from online CRC calculator e.g. https://crccalc.com/. (actualy the results are differ whatever string I use). Could you please describe how particular bytes are processed or how to organize data to mach in other calculator? 

3. 
STL_CAN_RAM_checkErrorStatus(CANA_BASE):  occasionally returns STL_CAN_RAM_ERROR after applying the first testing pattern. What could be the problem?
I am using it in the following way

        #define CANMSGRAM_END              0x4C7FFUL 
       ...
        uint16_t uiTestResult;
        STL_CAN_RAM_testRAM(CANA_BASE, STL_MARCH_PATTERN_ONE, CANA_MSG_RAM_BASE, CANMSGRAM_END, STL_CAN_RAM_NO_COPY);
        uiTestResult = STL_CAN_RAM_checkErrorStatus(CANA_BASE);
        STL_CAN_RAM_testRAM(CANA_BASE, STL_MARCH_PATTERN_TWO, CANA_MSG_RAM_BASE, CANMSGRAM_END, STL_CAN_RAM_NO_COPY);
        uiTestResult |= STL_CAN_RAM_checkErrorStatus(CANA_BASE);
        STL_CAN_RAM_testRAM(CANA_BASE, STL_MARCH_PATTERN_THREE, CANA_MSG_RAM_BASE, CANMSGRAM_END, STL_CAN_RAM_NO_COPY);
        uiTestResult |= STL_CAN_RAM_checkErrorStatus(CANA_BASE);
        STL_CAN_RAM_testRAM(CANA_BASE, STL_MARCH_PATTERN_FOUR, CANA_MSG_RAM_BASE, CANMSGRAM_END, STL_CAN_RAM_NO_COPY);
        uiTestResult |= STL_CAN_RAM_checkErrorStatus(CANA_BASE);

4.
STL_HWBIST_runFull(STL_HWBIST_NO_ERROR): when debugging, the code crashes at line 388 in stl_hwbist_s.asm and it is invoked error message "Can't Single Step Target Program" / Can't Run Target CPU