Part Number: TMS320F280025C-Q1
Tool/software:
Team,
Could you please help with the below:
We use COMP and DAC elements to create a window comparator.
COMPH and COMPL are coupled with OR logic to trigger an interrupt when passing through the window.
The two window thresholds are determined from two DAC outputs.
The DACs are powered by VDDA (3.5V).
The two thresholds are close together, raising the question of error distribution, which could, in the worst case scenario, lead to a reversal/overlap of the two thresholds.
Our current configuration:

Hysteresis x4
DAC H VAL (1931-80)LSB
DAC L VAL (1931+128)LSB
Question 1
In the datasheet SPRS45 section 6.12.5.1.3 CMPSS illustrative Graphs:
Is it possible, based on these curves, to evaluate the error around our operating point (1931 LSB) rather than taking the maximum error and applying it to the entire DAC range (worst-case method)?

Question2:
Is it possible to consider a strong error dependency between the two COMPH/COMPL elements?
Is it possible to consider a strong error dependency between the two DAC elements?
In which case, the two thresholds will vary in the same direction and will not risk inversion/overlap of the two.
Thanks in advance,
Anthony
