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TMS320F28P550SJ: CPU testing for IEC60730

Part Number: TMS320F28P550SJ
Other Parts Discussed in Thread: C2000WARE

Tool/software:

Hi champs,

I am asking this for our customer.

The user refers to the STL library for IEC60730.

C:\ti\c2000\C2000Ware_5_05_00_00\libraries\diagnostic\f28p55x

Questions:

1. For CPU testing, the user is testing the function STL_CPU_REG_testCPURegisters() in stl_cpu_reg.asm.

It's weird that the user has run it periodically every 100 ms and found it could fail (wrong return value - not zero) if the user tested it for more then a few minutes.

Do you have any comment?

Is it possible that this function may overflow the stack or memory for long-time testing?

2. For CPU testing, 

when the user tests like this.

main()

{

...

while(1)

{

...

DINT;

status = STL_CPU_REG_testCPURegisters();

EINT;

...

}

Then, the user find if there are some other ISR like Timer0 ISR, it's likely the Time0 ISR would not get serviced after longer testing (say for a few seconds).

Therefore, we are confused, if STL_CPU_REG_testCPURegisters() would handle any related to PIE?

Does the user have to store the status of PIE before DINT and calling STL_CPU_REG_testCPURegisters()?

3. Is there any limitation to use STL_CPU_REG_testCPURegisters()?