• State Resolved
  • Locked Locked
  • Replies 2 replies
  • Subscribers 82 subscribers
  • Views 235 views
  • Users 0 members are here
Support feedback
Options
Options
Related

This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

TMS320F280021: XDS110 connection error -215

Fabio Mannino
Intellectual 785 points
Part Number: TMS320F280021


Tool/software:

Hello,

CCS Version: 20.3.0.14__1.9.0 Default VS Code API: 1.96.0

XDS110 debug probe

custom board with F280021.

When I execute the Run->Debug project command (F5), CCS loops in the "Starting CCS debug session..." status, then after a while the error -215 appears.

IcePick_C_0: Error connecting to the target: (Error -215 @ 0x0) The semaphore for the test bus controller is in a time-out state. Unified-SCIF was unable to acquire the semaphore used to express ownership of a controller by a utility or debugger. You may have to exit other clients because the timeout occurred. (Emulation package 20.3.0.3656)

After that even pressing the Cancel button the Starting CCS debug session... message remains in the CCS window corner. 

If I run again the debug project command I get the message "A Code Composer Debug session is in progress, press Continue to terminate it and continue with starting a new debug session". When I press the Continue button nothing changes, CCS keeps looping Starting CCS debug session... Sometimes I need to close and restart CCS to stop it. When I restart I get the CCS Crash report message:
A crash was encountered during the last CCS session. To help us resolve the issue, please click Submit to send us the crash logs. Please update your installation if updates are available.
View details button does nothing.

I have several identical boards and no difference, I'm pretty sure they are not faulty. The JTAG scan test succeeds (see below).

The same happens if I run the Flash device command (ctrl+F5).
Exactly the same happens if I just disconnect th JTAG connector from the board, confirming that the this is not a JTAG/hardware related issue.

The problem started yesterday when I upgraded CCS from 20.2 to 20.3. I'm stopped because no JTAG programming is possible now. 

Thanks for any help.

Fabio

JTAG scan oputput

-----[Print the board config pathname(s)]------------------------------------ C:\Users\xxxxx....\ CCS\ccs2020\0\1\BrdDat\testBoard.dat -----[Print the reset-command software log-file]----------------------------- This utility has selected a 100/110/510 class product. This utility will load the adapter 'jioxds110.dll'. The library build date was 'Aug 12 2025'. The library build time was '02:44:21'. The library package version is '20.3.0.3656'. The library component version is '35.35.0.0'. The controller does not use a programmable FPGA. The controller has a version number of '5' (0x00000005). The controller has an insertion length of '0' (0x00000000). This utility will attempt to reset the controller. This utility has successfully reset the controller. -----[Print the reset-command hardware log-file]----------------------------- The scan-path will be reset by toggling the JTAG TRST signal. The controller is the XDS110 with USB interface. The link from controller to target is direct (without cable). The software is configured for XDS110 features. The controller cannot monitor the value on the EMU[0] pin. The controller cannot monitor the value on the EMU[1] pin. The controller cannot control the timing on output pins. The controller cannot control the timing on input pins. The scan-path link-delay has been set to exactly '0' (0x0000). -----[Perform the Integrity scan-test on the JTAG IR]------------------------ This test will use blocks of 64 32-bit words. This test will be applied just once. Do a test using 0xFFFFFFFF. Scan tests: 1, skipped: 0, failed: 0 Do a test using 0x00000000. Scan tests: 2, skipped: 0, failed: 0 Do a test using 0xFE03E0E2. Scan tests: 3, skipped: 0, failed: 0 Do a test using 0x01FC1F1D. Scan tests: 4, skipped: 0, failed: 0 Do a test using 0x5533CCAA. Scan tests: 5, skipped: 0, failed: 0 Do a test using 0xAACC3355. Scan tests: 6, skipped: 0, failed: 0 All of the values were scanned correctly. The JTAG IR Integrity scan-test has succeeded. -----[Perform the Integrity scan-test on the JTAG DR]------------------------ This test will use blocks of 64 32-bit words. This test will be applied just once. Do a test using 0xFFFFFFFF. Scan tests: 1, skipped: 0, failed: 0 Do a test using 0x00000000. Scan tests: 2, skipped: 0, failed: 0 Do a test using 0xFE03E0E2. Scan tests: 3, skipped: 0, failed: 0 Do a test using 0x01FC1F1D. Scan tests: 4, skipped: 0, failed: 0 Do a test using 0x5533CCAA. Scan tests: 5, skipped: 0, failed: 0 Do a test using 0xAACC3355. Scan tests: 6, skipped: 0, failed: 0 All of the values were scanned correctly. The JTAG DR Integrity scan-test has succeeded.