TMS320F280039: Clarification about datasheet warning of flash data corruption

Evelyn Parenteau

Hello,

I am implementing in-field programming of some the flash memory in a F28003x-based device using FAPI library. I noticed the following warning in the datasheet:

"Brownout events during flash programming can corrupt flash data and permanently lock the device." (SPRSP61C, section 6.5.1)

I want to make sure I understand the risk here. Which of the following is true:

1. Brownout events during flash programming can cause partial writes/erases to occur, which would lead to ECC failures for the area of memory that was being erased/programmed during the brownout, and this condition could be recovered by reprogramming OR

2. Brownout events during flash programming can cause something worse than ECC failures that cannot be recovered from, or corruption of flash memory aside from the areas being erased/programmed

10 months ago

+1 Marlyn Rosales Castaneda20 10 months ago

TI__Mastermind 27190 points

Hi Evelyn,

We do not characterize what happens to the device when a brownout event occurs. Meaning, it could be that the flash data stays unaffected, there could be partial writes/erases that occur, or corruption of areas outside what is being erased/programmed. The behavior is not something we check/test before devices ship TI. This note is added as a notice to users that power should be stable during flash programming and to avoid brownout events as they could affect the flash data.

Best Regards,

Marlyn

0 Evelyn Parenteau 10 months ago in reply to Marlyn Rosales Castaneda20

Prodigy 20 points

Thanks Marlyn, this is very clear.

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TMS320F280039: Clarification about datasheet warning of flash data corruption