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TMS320F28027F: Issue with board, loading code

Haridhana Arumugam
Prodigy 10 points

Part Number: TMS320F28027F
Other Parts Discussed in Thread: TMS320F28027, LAUNCHXL-F28027F

I previously tried to submit to E2E with case number CS3443696. I had an old email address and thus was unable to get support. After changing email address the order for the board is no longer showing up. Hope this does not cause issues.

Submitting for E2E support

I am unable to load code onto brand new board. Getting error with boot switches in 1:on 2:on 3:on and 3:off

Error connecting to the target:
(Error -1135 @ 0x0)
The debug probe reported an error. Confirm debug probe configuration and connections, reset the debug probe, and retry the operation.
(Emulation package 9.4.0.00129)

 

Error when trying with boot switches 1:off, 2:on, 3:on

C28xx: GEL Output: 
Device Calibration not complete, check if device is unlocked and recalibrate.C28xx: Flash Programmer: Warning: The configured device (TMS320F28027), does not match the detected device (). Flash Programming operations could be affected. Please consider modifying your target configuration file.
C28xx: GEL Output: 
Device Calibration not complete, check if device is unlocked and recalibrate.C28xx: Flash Programmer: Device is locked or not connected. Operation cancelled.
C28xx: File Loader: Memory write failed: Unknown error
C28xx: GEL: File: C:\Users\apsam\All_Files\Power Electronics\Photovoltaic\PWM_Example\Flash\PWM_Example.out: Load failed.

I was previously able to load this code on another board that I ended up physically damaging. 

 

Output from Test Connection from .ccxml file:

[Start: Texas Instruments XDS100v2 USB Debug Probe_0]

Execute the command:

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]


-----[Print the board config pathname(s)]------------------------------------

C:\Users\apsam\AppData\Local\TEXASI~1\CCS\
    ccs1040\0\0\BrdDat\testBoard.dat

-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Jun 25 2021'.
The library build time was '11:45:30'.
The library package version is '9.4.0.00129'.
The library component version is '35.35.0.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

There is no hardware for programming the JTAG TCLK frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

There is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 64 32-bit words.

The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.

The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG IR Integrity scan-test has failed.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 64 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG DR Integrity scan-test has failed.

[End: Texas Instruments XDS100v2 USB Debug Probe_0]

 

i have also tried to unlock the board with the Code Security Password FFFF in all fields, and erase Flash sector A,B,C,D and got:

C28xx: Starting device unlocking...
C28xx: Flash Programmer: Error unlocking flash memory. Device is still locked
C28xx: Erasing Flash memory...
C28xx: Flash Programmer: Error erasing flash memory. Device is locked or not connected. Operation cancelled

  • 0
    TI__Genius 17361 points

    Hello, please note Friday was US holiday and the SME is OOO today, you should hear back tomorrow.

  • 0 in reply to Joe Prushing
    TI__Expert 3790 points

    Hi,

    I apologize for the late response as I was previously OOO. 

    Can you confirm that there is NOT a password programmed onto the device?

    Kind regards,
    AJ Favela 

  • 0 in reply to AJ Favela
    Prodigy 10 points

    There is no password programmed. This issue occurred fresh out of the box.

  • 0 in reply to Haridhana Arumugam
    TI__Expert 3790 points

    Hi,

    Can you confirm that you are using an XDS100V2 as your debugger. Additionally can you take a look at our JTAG connectivity debug document. This lists a few debugging steps you can take, specifically in table 4-1.

    Kind regards,
    AJ Favela 

  • 0 in reply to AJ Favela
    Prodigy 10 points

    Apologies, I have been busy with another project. I am a bit of newbie to this, so apologies if my questions are a bit mundane or misguided.

    I am using XDS100V2 in the .ccxml

    I looked in the debug document, and the relevant errors are: 

    • The JTAG IR Integrity scan-test has failed. The JTAG DR Integrity scan-test has failed., for which I have tried a lower clock freqeuency of 200kHz which has not fixed the issue
    • C28xx_CPU1: Error: (Error -1044 @ 0x0) The debug probe reported an error. Confirm debug probe configuration and connections, reset the debug probe, and retry the operation. This also recommended decreasing the frequency but this error has not gone away. It also recommend power cycling the debug probe while keeping the mcu the same. Should I be powering the MCU with 3.3V DC supply?

    For the suggestion power cycling trouble shooting, I am not sure if this is the fix as booting with boot switches in (on,on,on) results in JTAG IR/DR Integrity Scan tests fail but booting with (on,on,off) is having no errors in test connection.

    I have read that this might be the result of faulty code in startup, but this same code worked fine on the exact same model board until the board was damaged physically. Additionally, I am unable to erase the flash memory or unlock the board using the expected FFFFFF passwords for a new board. 

    Is it possible that this board is faulty or had some errors during loading the firmware?

  • 0 in reply to Haridhana Arumugam
    TI__Expert 3790 points

    Hi,

    Our boards do not come locked. That is something that we leave up to the customer to implement. Additionally you won't be able to erase/program the flash until you have successfully connected to the device. 

    Can you 

    1. Describe the device that you are using, is it a LaunchPad? If so which Launchpad is it? I ask this because your earlier error messages mentions the following "Flash Programmer: Warning: The configured device (TMS320F28027), does not match the detected device ()."

    2. Can you describe which physical debugger you are using? Is it an XDS debugger, or are you using the one found physically located on the board (i.e. on a LaunchPad)? 

    3. Can you show me a image of your current setup?

    Kind regards,
    AJ Favela 

  • 0 in reply to AJ Favela
    Prodigy 10 points

    1. This is the C2000 Piccolo Launchpad LAUNCHXL-F28027F
    2. I am using the one located on the board. It says it has the onboard XDS 100 V2, same as the one i selected in the NewTargetConfiguration.ccxml file
    3.

     

  • 0 in reply to Haridhana Arumugam
    TI__Expert 3790 points

    Hi,

    Can you attempt to put the device in wait boot mode and attempt connection via both a 'test connection' and debug session? This can be done by setting S1 to the following configuration 1:off, 2:on, 3:off.

    If connection fails please share the fail message for each one that fails.

    Kind regards,
    AJ Favela