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F2811 blown (physically damaged during Flash Programming)

Magnus Wohlfart
Expert 3020 points
Other Parts Discussed in Thread: TEST2

Hi Guys,

I have a customer who is permanently damaging (blowing) the F2811 DSP when attempting to program the FLASH the JTAG. So far he has damaged 6 parts on different PCBs. He tried using a different emulator and also a different PC but the problem still occurs.

If he manages to succesfully progam the FLASH, the DSP works properly and doesn't "blow". He's working in a anti-static controlled environment and has used other C2000 parts and the same programming environment successfully for the past 5 years without any problems. The DSP is powered via a TPS767D301PWP LDO, also a tried and tested implementaion.

I was able to find out that he doesn't stick to the recommended power up sequence and is ramping up 1.8V and 3.3V simultaneously, could this cause such problems?

The parts affected are all G revision.

 

Thanks in advance,

 

Magnus

  • TI__Expert 8500 points

    Magnus,

    It is possible that the incorrect power sequencing is causing the problem. This is specifically in there for flash reliability concerns. I would have expected it to be long term reliability, not a sudden EOS though.

    Is VDD3VFL stable during programming? Are the TEST1 and TEST2 pins left unconnected? Are they programming at the correct frequency? Are the other C2000 parts successfully programmed in this environment of the F281x type or another, like F280x. The power sequencing is probably the biggest difference with regards to flash between these two sets of devices.

    Regards,
    Dave Foley