Hi everyone,
I have a C2000-Launchpad and was using it to run a program generated from simulink.
To do so, I was using CCS4, connecting to the target, downloading the code and running it.
Last week, while the code was running, code composer showed a message abou the connection being lost, I was a little distracted and just closed the message and tried to connect again. Since then I'm receiving the following message:
And if I retry, it changes to:
Although it shows up in windows device manager:
I don't know what may have happend, and googling around I could not find a way to get it working again.
Actually I don't even know if this is a Target or Emulator(XDS) problem..
I was able download and run code on it many times before this problem happend.
Board: C2000 Launchpad (All jumpers connected and all switches in the up position)
Emulator: Built-in XDS100v2
CCS v4 or v5 (the error shows up on both)
Here is an output of a jtag test i did:
[Start] Execute the command: %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity [Result] -----[Print the reset-command software log-file]----------------------------- This utility has selected a 100- or 510-class product. This utility will load the adapter 'jioserdesusb.dll'. The library build date was 'Dec 19 2011'. The library build time was '21:32:12'. The library package version is '5.0.569.0'. The library component version is '35.34.39.0'. The controller does not use a programmable FPGA. The controller has a version number of '4' (0x00000004). The controller has an insertion length of '0' (0x00000000). This utility will now attempt to reset the controller. This utility has successfully reset the controller. -----[Print the reset-command hardware log-file]----------------------------- The scan-path will be reset by toggling the JTAG TRST signal. The controller is the FTDI FT2232 with USB interface. The link from controller to target is direct (without cable). The software is configured for FTDI FT2232 features. The controller cannot monitor the value on the EMU[0] pin. The controller cannot monitor the value on the EMU[1] pin. The controller cannot control the timing on output pins. The controller cannot control the timing on input pins. The scan-path link-delay has been set to exactly '0' (0x0000). -----[The log-file for the JTAG TCLK output generated from the PLL]---------- There is no hardware for programming the JTAG TCLK frequency. -----[Measure the source and frequency of the final JTAG TCLKR input]-------- There is no hardware for measuring the JTAG TCLK frequency. -----[Perform the standard path-length test on the JTAG IR and DR]----------- This path-length test uses blocks of 512 32-bit words. The test for the JTAG IR instruction path-length succeeded. The JTAG IR instruction path-length is 0 bits. The test for the JTAG DR bypass path-length succeeded. The JTAG DR bypass path-length is 0 bits. -----[Perform the Integrity scan-test on the JTAG IR]------------------------ This test will use blocks of 512 32-bit words. This test will be applied just once. Do a test using 0xFFFFFFFF. Scan tests: 1, skipped: 0, failed: 0 Do a test using 0x00000000. Scan tests: 2, skipped: 0, failed: 0 Do a test using 0xFE03E0E2. Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0. Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0. Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0. Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0. Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0. Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0. Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0. Test 3 Word 7: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0. The details of the first 8 errors have been provided. The utility will now report only the count of failed tests. Scan tests: 3, skipped: 0, failed: 1 Do a test using 0x01FC1F1D. Scan tests: 4, skipped: 0, failed: 2 Do a test using 0x5533CCAA. Scan tests: 5, skipped: 0, failed: 3 Do a test using 0xAACC3355. Scan tests: 6, skipped: 0, failed: 4 Some of the values were corrupted - 66.7 percent. The JTAG IR Integrity scan-test has failed. -----[Perform the Integrity scan-test on the JTAG DR]------------------------ This test will use blocks of 512 32-bit words. This test will be applied just once. Do a test using 0xFFFFFFFF. Scan tests: 1, skipped: 0, failed: 0 Do a test using 0x00000000. Scan tests: 2, skipped: 0, failed: 0 Do a test using 0xFE03E0E2. Test 3 Word 0: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0. Test 3 Word 1: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0. Test 3 Word 2: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0. Test 3 Word 3: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0. Test 3 Word 4: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0. Test 3 Word 5: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0. Test 3 Word 6: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0. Test 3 Word 7: scanned out 0xFE03E0E2 and scanned in 0xFC03C0C0. The details of the first 8 errors have been provided. The utility will now report only the count of failed tests. Scan tests: 3, skipped: 0, failed: 1 Do a test using 0x01FC1F1D. Scan tests: 4, skipped: 0, failed: 2 Do a test using 0x5533CCAA. Scan tests: 5, skipped: 0, failed: 3 Do a test using 0xAACC3355. Scan tests: 6, skipped: 0, failed: 4 Some of the values were corrupted - 66.7 percent. The JTAG DR Integrity scan-test has failed. [End]
Already tried:
1 - Reinstall drivers on windows.
2 - Reprogram FT2232H eeprom
And measured some voltages on the board:
USBVcc = 4.68 V
FTDI_3v3 = 3.27 V
FTDI_1v8 = 1.75 V
+5V = 4.3 V
+3v3 = 3.2 V
Does anyone had a similar problem?
Is there anything else I can do or the board is useless forever?
Thank you!
