Hello TI,
From my customer - please see below:
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We had some problem with ADC sampling using DSP F28335. Voltage waveform were clipping over a certain voltage level for some ADC channel. After increase the acquisition time from 40nsec to 80nsec, the problem appear to be fixed. The sampling frequency for each channel is 10KHz.
My basic understanding is that the internal circuit of the ADC needs time to settle during sampling. The two sample and hold of the internal ADC for F28335 are multiplexed and support max 16 channels. The circuit model of the internal ADC has input ESD capacitor, the sampling switch SW with an equivalent on-resistance RSW to the sampling capacitor CSH. When we apply a step voltage input to the circuit, min acquisition time will allow the voltage across CSH to stabilize to 1/2 of LSB.
I was able to follow the app note below to calculate the min acquisition time for ADC.
http://www.ti.com/lit/an/sbaa173a/sbaa173a.pdf
I was able to reproduce the same answer as shown as example in the app note, using the circuit values given.
For our design, we drive each ADC channel using op-amp followed by an analog switch. R1 is our analog switch resistance which is max 100 Ohm. C1 is the input capacitor specified by the data sheet of F28335 as typical 10nF.
In the app note, C2 (CSH) is 50pF, R2 (RSW) was given in 20 Ohm or 2000 Ohm in the example.
If I use R2=20 Ohm and C2=50pF, the min t_ACQ is 80.9 nsec.
If I use R2=100 Ohm and C2=50pF , the min t_ACQ is 124.5 nsec.
I would like to confirm if I can follow the app note above to calculate the min acquisition time for the ADC of F28335 for our design. If yes, what would be the CSH (sample and hole capacitor) and RSW (switch resistance) for the ADC of F28335 that I can use for calculation?
If this is not the proper app note to follow, do you have any other reference document that can be used to determine the min acquisition time for the ADC of F28335?
