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Connection problem with launchpad

Simon Ravyts
Intellectual 510 points
Other Parts Discussed in Thread: TMS320F280270, TMS320F28027, TMS320F28027F

Hello

I am trying to connect my launchpad C2000 piccolo F28027F evaluation kit with CCS v6.

When setting up the target configuration file, I cannot find the TMS320F28027F, only the TMS320F28027, TMS320F280270, experimenter's kit F28027 and controlstick piccolo F28027

I tried with all of them but none of them seems to work. I have put the connection to 'Texas Instruments XDS100v1 USB Debug Probe' but I don't really understand what connection to choose. If I click the 'Test connection' button, most scans fail.


Could anyone give me some hints about this? I am following the C2000 microcontroller workshop via pdf.

Kind regards

Simon

  • 0
    Intellectual 510 points
    I already tried to use a previous version of CCS(v5) but the problem still exists.
  • 0 in reply to Simon Ravyts
    TI__Guru** 116021 points

    Hi Simon,

    Did you also tried "'Texas Instruments XDS100v2 USB Debug Probe' ? If not then try that and see  it helps.

    Regards,

    Vivek Singh

  • 0 in reply to Vivek Singh
    Intellectual 510 points

    Yes indeed I tried, this is the report I get:

    [Start: Texas Instruments XDS100v2 USB Debug Probe_0]

    Execute the command:

    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

    [Result]


    -----[Print the board config pathname(s)]------------------------------------

    C:\Users\sravyts\AppData\Local\TEXASI~1\
        CCS\PROGRA~1\0\0\BrdDat\testBoard.dat

    -----[Print the reset-command software log-file]-----------------------------

    This utility has selected a 100- or 510-class product.
    This utility will load the adapter 'jioserdesusb.dll'.
    The library build date was 'Jul 27 2016'.
    The library build time was '18:31:37'.
    The library package version is '6.0.407.3'.
    The library component version is '35.35.0.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '4' (0x00000004).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.

    -----[Print the reset-command hardware log-file]-----------------------------

    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the FTDI FT2232 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for FTDI FT2232 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    -----[The log-file for the JTAG TCLK output generated from the PLL]----------

    There is no hardware for programming the JTAG TCLK frequency.

    -----[Measure the source and frequency of the final JTAG TCLKR input]--------

    There is no hardware for measuring the JTAG TCLK frequency.

    -----[Perform the standard path-length test on the JTAG IR and DR]-----------

    This path-length test uses blocks of 64 32-bit words.

    The test for the JTAG IR instruction path-length failed.
    The JTAG IR instruction scan-path is stuck-at-ones.

    The test for the JTAG DR bypass path-length failed.
    The JTAG DR bypass scan-path is stuck-at-ones.

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG IR Integrity scan-test has failed.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 64 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG DR Integrity scan-test has failed.

    [End: Texas Instruments XDS100v2 USB Debug Probe_0]

    And this is what I get want I want to enter the debug mode:

    Error connecting to the target:
    (Error -1135 @ 0x0)
    The debug probe reported an error. Confirm debug probe configuration and connections, reset the debug probe, and retry the operation.
    (Emulation package 6.0.407.3)

    Any other ideas?

  • 0 in reply to Simon Ravyts
    TI__Guru** 116021 points
    Hi Simon,

    Do you have another Launchpad which you could try?

    Vivek Singh
  • 0 in reply to Vivek Singh
    TI__Guru** 116570 points
    For TMS320F28027F LaunchPad
    1. Select 'Texas Instruments XDS100v2 USB Debug Probe' , and TMS320F28027.
    2. Connect JP1, JP2, JP3
    3. Boot Switch 1, 2, 3 select 'ON'
  • 0 in reply to Yanming Luo
    Intellectual 510 points

    I tested with another Launchpad and it worked immediately. Really weird because the serial connection for the demo application 'Temperature measurement' works perfectly!

    Thanks for your advice!