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TMS320F28377S Emulator not connected

Chieh Yang
Prodigy 30 points

Other Parts Discussed in Thread: CONTROLSUITE, TMS320F28377S

Hi sir/madam

    I have run into problems when connecting F28377S and the CCS. Here is the steps that I have done:

  1. I installed CCS 6.2 and control suite.
  2. F28377S is connected to PC with USB cable 
  3. I took the example file from C:\ti\controlSUITE\device_support\F2837xS\v210\F2837xS_examples_Cpu1 to test the QEP with the encorder and launched debug
  4. It asked me to create a NewTargetConfiguration file and to choose the connection and device                                  
  5. First I chose the Spectrum Digital C2000 XDS510LC Emulator and couldn't found the correct board number (TMS320F28377S). When I searched for any helpful imformation and realized that it is the wrong emulator i had chosen. 
  6. Then I chose the Spectrum Digital XDS510USB Emulator and found the TMS320F28377S.
  7. When I tested the connection after saved, there was a error pop up like below:

    [Start: Spectrum Digital XDS510USB Emulator_0]

    Execute the command:

    %ccs_base%/emulation/drivers/sdjtag.exe -f %boarddatafile% -v -X reset -X scantest

    [Result]

    ** BoardFilePath: C:\Users\Jack-2\AppData\Local\TEXASI~1\CCS\ti\0\0\BrdDat\testBoard.dat
    ** Resetting Emulator
    ERROR -- XDS510-USB Emulator not connected/enumerated

    [End: Spectrum Digital XDS510USB Emulator_0]

    [Start: UARTConnection_0]

    Execute the command:

    The Diagnostic Command is not defined in the connection properties.

    Is there anything I have doing it wrong ? 


    With regards,

  • 0
    TI__Guru** 116971 points

    Hi,

    Error says emulator not connected/enumerated. Please check that USB cable is connected properly. When you click on the "Test Connection", you should see a USB enumeration window pop-up.

    Regards,

    Vivek Singh

  • 0 in reply to Vivek Singh
    Prodigy 30 points

    Hi Vivek
    Thanks for the response. I have try other USB ports, cables and different computer to check that the USB cable is connected properly.

    And the USB enumeration window you mentioned is different from the Test Connection window ?
    Is the Spectrum Digital XDS510USB Emulator the right emulator I should choose for F28377S ?

    Thanks and regards,

    Jack

  • 0 in reply to Chieh Yang
    Guru 192875 points
    Hi Jack,

    The debug probe should be XDS100v2 and not XDS510USB.

    Regards,
    Gautam
  • 0 in reply to Gautam Iyer
    Prodigy 30 points

    Thanks Gautam!!! It seems pass through the test connection, but I'm not sure is there something wrong of the highlight part below.


    [Start: Texas Instruments XDS100v2 USB Debug Probe_0]
    Execute the command:
    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

    [Result]
    -----[Print the board config pathname(s)]------------------------------------
    C:\Users\Jack-2\AppData\Local\TEXASI~1\CCS\ti\0\0\BrdDat\testBoard.dat
    -----[Print the reset-command software log-file]-----------------------------
    This utility has selected a 100- or 510-class product.
    This utility will load the adapter 'jioserdesusb.dll'.
    The library build date was 'Oct 6 2016'.
    The library build time was '20:21:35'.
    The library package version is '6.0.407.6'.
    The library component version is '35.35.0.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '4' (0x00000004).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.
    -----[Print the reset-command hardware log-file]-----------------------------
    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the FTDI FT2232 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for FTDI FT2232 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    -----[The log-file for the JTAG TCLK output generated from the PLL]----------
    There is no hardware for programming the JTAG TCLK frequency.
    -----[Measure the source and frequency of the final JTAG TCLKR input]--------
    There is no hardware for measuring the JTAG TCLK frequency.

    -----[Perform the standard path-length test on the JTAG IR and DR]-----------
    This path-length test uses blocks of 64 32-bit words.
    The test for the JTAG IR instruction path-length succeeded.
    The JTAG IR instruction path-length is 6 bits.
    The test for the JTAG DR bypass path-length succeeded.
    The JTAG DR bypass path-length is 1 bits.

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------
    This test will use blocks of 64 32-bit words.
    This test will be applied just once.
    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 0
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 0
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 0
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 0
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 0
    All of the values were scanned correctly.
    The JTAG IR Integrity scan-test has succeeded.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------
    This test will use blocks of 64 32-bit words.
    This test will be applied just once.
    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Scan tests: 2, skipped: 0, failed: 0
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 0
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 0
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 0
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 0
    All of the values were scanned correctly.
    The JTAG DR Integrity scan-test has succeeded.

    [End: Texas Instruments XDS100v2 USB Debug Probe_0]

     

    And when I debug the example program(Eqep_pos_speed.c) for testing the eQEP function, an error window pop-up.


    Thanks and regards,

    Jack