Part Number: TMS320F28027F
All,
I'm using the STL_CRC_TEST_testNvMemory() function in the IEC_60730 ti firmware to calculate the Flash CRC for memory regions B thru D. Calculating the CRC at the start of the program yields the same CRC each time. If I run the same CRC function during operation, I get a different CRC result and that result will change in subsequent calls. I currently do not have any functions in the program that modify Flash. Any help would be much appreciated.
void IEC_Running_CRC(void) {
DINT;
IEC_disableFlashPreFetch();
STL_CRC_TEST_testNvMemory((uint32_t *)FLASH_SECTOR_B_D_START,(uint32_t *)FLASH_SECTOR_B_D_END,(uint64_t *)&gGoldenCRC[4],NV_TYPE_FLASH);
gCRC = STL_CRC_TEST_getCrcResult();
IEC_enableFlashPreFetch();
EINT;
}
Regards,