TMS320F28023: For the data retention duration time of the built-in flash ROM of the TMS320F28023.

Hi,

Where did you get these retention numbers? F28023 datasheets says with Tj = 55'C, data retention is guaranteed for minimum of 15 years. I don't see the information you have provided.

Regards,

Manoj

Hi Champs,

I am an FAE for TIJ.
Regarding 1), it was calculated by using our eV and test time with the Arrhenius equation explained in the web.
But I made a mistake so please ignore the hours shown in this sled.
Will take care of it locally.

For 2) and 3) , Could you please let us know your observation?

Thank you for your kind help.
Best regards,
Hitoshi

Hitoshi,

We are looking into your request. Please expect a feedback from us within next couple of business days.

Regards,

Manoj

The 15 year minimum data retention at 55C comes from an AEC-Q100 mission profile.

For this generation of product, we studied the thermally accelerated data retention capacility of this flash with extended reliability conditions above JEDEC/AEC-Q100 conditions. Propriatory TI reliability models show the useful life with respect to data retention is much better than 15 years at 55C.

The Data retention for programmed bits for this product should be ok 2 years @ 125C / 10 years @ 105C which is the useful life numbers we have given in table 4.2 under http://www.ti.com/lit/an/sprabx4/sprabx4.pdf    (For 55C should be > 100 years)

Being thermally activated this data retention temperature should applies to both Power on and Power off conditions. An assumption is that when the applicaiton is powered off, it cools down to a more benign ambient temperature and does not stay at elevated temperatures above 105C. (For example an automotive Q100 assumes 15 year lifetime but ~10% of that is powered on. Most of it's 15 year life is powered off and during that power off, the car starts to cool down to ambient temperature).

Finally note the TI disclaimers on our reliabilitiy modeling - see http://www.ti.com/quality/docs/estimator.tsp  . They are not guarantees which is what your question 2 asks about. The paper http://www.ti.com/lit/an/sprabx4/sprabx4.pdf discusses how to assess if our C2000 part (designed to have a useful life of 10 years power on @ 105C Tj) is suitable for your intended end system reliability goal.