Other Parts Discussed in Thread: TMS320F28335
Hi,
After serious attempts to improve EMC issues and quality of our 512khz/16Bit measurement with built-in ADC - we still see artefacts...
->artefacts synchronous with system processing, irq execution or external SRAM burst access
->deviation relative to input signal
->1 or 2 samples
We have seen 29LSB spikes related to XINTF access with TMS320F28335 in past projects ... extrapolating that to 16 bit - this would equal up to 500 LSB.
Any experience with external SRAM and 16Bit ADC Performance ?
rgds.
Wolfgang