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Data Retention / data endurance time available?

StephanS
Genius 4087 points

Is the Data Retention / data endurance time of C2000 MCUs internal flash available?

I cannot find any in the datasheets, only the number of programming cycles.

 

While discussing the limited data retention of flash, I was asked if  the C2000 MCUs have a given value for this time the data in flash is secure.

This could be important in applications that will and have to work for more than the typically (in other devices) given 10 years.

 

So is there a value available for this?

Is it powered or unpowered ?

 

  • 0
    TI__Guru** 119680 points

    Stephan,

    Do you have a local TI sales person to contact?  We do offer some information on this (opening remarks cut/paste below), but it is not disclosed publicly.  

    Be aware that FIT reliability parameters are not specifications and TI does not maintain or support any reliability prediction methodologies.  TI does periodically run accelerated life tests and other environmental tests to monitor the observed reliability characteristics of our products.  It is the results of such accelerated life tests that are reported in this letter.  As such, the data presented is representative solely of the material tested.  It in no way makes any guarantee as to the flash data retention lifetime of product shipped in the future.  Also, the information contained in this letter should be considered TI proprietary information, and should not be circulated external 

     

    Definition of FIT:

    The FIT (Failure-In-Time) rate is the expected number of failures per 10^9 device operating hours (114,155 years).  This does not mean that you run a single device for 114,155 years.  Rather, it is for a group of devices running for that number of total device hours, e.g. 5000 devices running for 22.8 years, 7500 devices running for 15.2 years, or 10,000 devices running for 11.4 years.

     

     

    Flash Data Retention Test Description:

     

    The flash data retention test is an accelerated life test consisting of high temperature bakes on packaged device units (as opposed to unpackaged silicon die).  This quality control test is performed on random device samples.  A pass is defined as 100% data retention.  Table 

  • 0 in reply to ChrisClearman
    Genius 4087 points

    I have contacted our local TI FAE, but he had no reliable information, only "data retention of 15 years should be no problem" and a general reliability link.

    Some other manufacturers DO offer this data retention info in their datasheet...

    How can we guarantee a certain lifetime of our products if there is no data retention, reliability, FIT or MTBF specified in the controller datasheet, only "periodically tested"?

  • 0 in reply to StephanS
    TI__Guru** 119680 points

    Stephan,

    Have your FAE contact me and I will send him the document to share with you, it has what you need.

    TI's stance is that Datasheets include information that we electrically test on every device.  Data retention is a statistical calculation based on a set of test data.

     

  • 0 in reply to ChrisClearman
    Genius 4087 points

    Okay, I got the document, thanks!

  • 0 in reply to ChrisClearman
    Prodigy 35 points

    Your answer to Stephan sounds like the same information that i need - what information, statistical or otherwise, on the retention of Flash memory particularly in a F2812. Would it be possible to have a copy?

    Thank you

    Jack D'Aeth

  • 0 in reply to Jack D'Aeth
    TI__Intellectual 1750 points

    The wafer technology that manufactures F2812 was primarily developed for automotive microcontrollers. That means the technology is capable of minimum of 15 years data retention. 

    Based on High temp storage life data, the FIT for data retention @ 55C / 60% confidence level,/1.0eV will be <0.2 F IT.

    On production devices, we 100% test each flash bit cell for data retention by programming the device and submitting it to a high temp wafer bake. After the bake, we read the data content and only ones that are still good are selected. xact details of the temperature and duration are propriatory to TI but it assures the intended lifetime of the device.

    Allan Webber
    Embedded Controllers QRE.

  • 0 in reply to Allan Webber
    TI__Guru 57255 points

    Jack,

    If you're looking for something more formal, you can have your TI salesperson or FAE contact me.  Otherwise add-me-as-a-friend on E2E and we can take this off the forum.


    Thank you,
    Brett Larimore
    Texas Instruments