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TMS320F28388D: Power up RAM Test for on-chip SRAM

Amulrass Vazhumuni
Intellectual 435 points

Part Number: TMS320F28388D
Other Parts Discussed in Thread: C2000WARE,

Hello,

I would like to get the recommendation from TI for the RAM test. Currently we are performing RAM test by writing a pattern and bit-inverted pattern and reading them back for the whole area of On-chip RAM.  In case of failure, the test is repeated again on the Faulted RAM block to confirm the fault. The Flow chart of the RAM test is shown below:

Is the above flowchart  is sufficient to validate the RAM fault? Or else, in case of a RAM fault what is the recommended number of times to repeat the RAM test to confirm it?

Are there any RAM Test Library available as a part of C2000Ware?

Best Regards

Amulrass V

  • 0
    TI__Guru** 117431 points

    Hi,

    We'll have our safety expert look into this. There could be some delay due to holiday week in USA.

    Regards,

    Vivek Singh

  • 0
    TI__Expert 7985 points

    Hi Amulrass, 

    We do not have support for TMS320F28388D device yet and it is planned for the future.  However, you can look at what we have available for other devices and use it as an example to do your own port. 

    Yes if you have a recent C2000Ware release available you can browse the <install>\libraries\diagnostic\f28004x\examples directory.  Please let us know if you have any additional questions. 

    Regards, 

    Krishna 

  • 0 in reply to Krishna Allam
    Intellectual 435 points

    Hello,

    I am aware that the safety manual for the TMS320F28388D device does not exist yet. So, I spent some time in analyzing the existing diagnostic libraries in C2000Ware. There the RAM test library implements March13n algorithm and it talks about runtime RAM test. However, I am concerned about the Power up RAM test.

    So, the intent of the RAM pattern test is to detect the Transient, Intermittent and Permanent Ram faults. If the above algorithm is sufficient to detect the three faults at the power up, then I would proceed with the same. I would like to know, if the above algorithm is not sufficient, or March13n is the better?. Please provide your thoughts.

    I believe this algorithm is not device specific.

    Best Regards

  • 0 in reply to Amulrass Vazhumuni
    TI__Expert 7985 points

    Hi Amulrass, 

    Please take a look at this application note for additional details on the memory test: https://www.ti.com/lit/pdf/spracb 

    You can also look at the safety manual for other devices that have similar content with respect to safety mechanisms.  The safety manuals are available here: www.ti.com/.../swab007

    Please review this capability versus the various failure modes that are applicable to your safety case to decide which algorithm to use.  

    Cheers!

    Krishna