Part Number: MSP430F5438A
Other Parts Discussed in Thread: MSP430F5438
Recently we were doing radiation testing with a design which has an MSP430F5438 . The proton beam was on the device and we were cycling the power to the device rapidly (approximately once every 20-30 seconds). At a point in the testing the MSP430 did not boot. In post analysis it appeared the flash had been corrupted. We had experienced this type of event in another test we were doing after several thousand power cycles, sans the radiation. I would like to know if there is any condition, during powering up of the MSP430, that the flash can be corrupted?
