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MSP430F and Marginal Read Mode

Richard Katz
Intellectual 290 points

Hi,

I have a question about the MSP430F microcontroller and Marginal Read Mode.

First, how often do parts fail this testing?  That is, one out of hundred?  One out of a thousand?  Are failures likely to occur soon after programming or after a long period of time?

Also, how much margin is there if the part passes Marginal Read Mode testing.  I understand from the documentation qualitatively what this mode does, but I have not yet found any quantitative assessment of this mode.

Thanks,

Rich :-)

  • 0
    Guru 321640 points

    The flash is specified to work for at least a hundred years at 25 °C and when properly programmed.

    The marginal read modes are intended to be used to detect errors after the flash was used at high temperatures or outside its specifications or with the smart write mode.

    SLAA392 has numbers.

  • 0
    Guru 34843 points

    From my experience, 1/10 will have marginal read error after smart write. Marginal read error is never reported after standard block write, room temperature.

    While in datasheet only request for marginal read test is 1 MHz MCLK, I noticed that result is depending also on VCC during marginal read. For example, after smart write, marginal read on 3.3V will report error, while marginal read on 1.8V will not report error.

  • 0 in reply to zrno soli
    Intellectual 290 points

    Hi,

    Thank you very much for the information.  I am just getting started here, so a rookie question:

    Can I exercise the marginal read test via a PC say through a JTAG connection and the development environment?  That is, can I load a pattern into the flash memory from the PC and read it back for verification in marginal read mode?

    Thanks,

    rich :-)

  • 0 in reply to Richard Katz
    Guru 34843 points

    Richard Katz said:

    Hi,

    Thank you very much for the information.  I am just getting started here, so a rookie question:

    Can I exercise the marginal read test via a PC say through a JTAG connection and the development environment?  That is, can I load a pattern into the flash memory from the PC and read it back for verification in marginal read mode?

    Thanks,

    rich :-)

    You can compare, after flashing, each word from PC file with target device, word by word (for both marginal read modes MR0 / MR1). But it can be done on simple way, comparing PC calculated CRC file value with CRC marginal read calculated values. Your code can be downloaded to target device RAM, and executed from there.
    Don't know about marginal read related to other MSP430 hardware / software tools because I am using my own sbw+ flasher.
    D:\msp430>flash -p com21 -f test_msp430f5510.txt -vcc 22 -wt -e -w -v -mr 

File: "test_msp430f5510.txt"
Address: 08000  Words: 16384
Size: 32768 bytes

Set VCC 2,2 V

Get Device
# JTID Fuse Device Core Hard Soft LotWafer DieX DieY
0  91   OK   3881  1106  10   10  219CA446 1800 0F00
1  91   OK   5435  0100  10   10  ADE98146 0A00 2100
2  91   OK   3180  1104  12   12  013BB046 1200 1E00
3  91   OK   3180  1104  12   12  013BB046 0D00 1E00
4  91   OK   5435  0100  10   10  ADE98146 0400 2000
5  91   OK   3180  1104  12   12  013BB046 2A00 2100
6  91   OK   3080  1104  30   10  B15B9446 2000 1700
7  91   OK   3081  2106  10   10  B7A50951 0A00 1100

Write Test
Smart  #0    #1    #2    #3    #4    #5    #6    #7
  0    93,8 100,6 102,0 102,2 102,5 103,3 105,4 106,4
  1   216,8 232,5 235,7 236,1 236,9 238,6 243,6 245,9

Erase

Write
Time: 410 ms  Speed: 77,9 KB/s

Verify
Time: 157 ms  Speed: 202,8 KB/s

Marginal Read
     File  #0   #1   #2   #3   #4   #5   #6   #7
MR0: C841 C841 C841 C841 C841 C841 C841 C841 C841
MR1: C841 C841 C841 C841 C841 C841 C841 C841 C841
Time: 467 ms  Speed: 68,4 KB/s

Release Device

Total Time: 1328 ms

D:\msp430>

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