We've been quite happy and impressed with the programmability, performance, and feature set of the DRV8353R as well as the other DRV parts we've used over the years. Something we continue to struggle with, however, is a high rate of GDF and other gate driver related failures during prototyping and testing. These tend to crop up frequently especially when we are trying to push motors into overmodulation (overmodulation above 0.57 or 100% sinusoidal duty cycle) and can also happen at other times both randomly and when we get noise events when using hall effect sensors that result in brief miscommutation. Is it possible or recommended that we add Zener diodes or other protection features to the gate drive lines and/or the VM input pins to better guard against this? The DRV for the post part tends to protect the power stage (FETs) but that doesn't really help a lot if the DRV part itself still fails. Would setting tighter controls / limits on the VDS voltage, OCP, and other limits also help? We tend to leave these limits a little more open during prototyping and testing, but we'd really like to lower the incidents of failures we are seeing and we are very concerned this may crop in production hardware if we choose to move forward.