Tool/software:
Hello
We have designed TI IC That MCU and Gate Driver (MCU : F2800156 / Gate Driver : DRV8329-Q1)
But, There is problem so please check and give solution
1. Situation
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During the phase-to-GND short-circuit fault diagnostic test, the fault cannot be latched/confirmed.
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Root cause: When the short occurs, the gate driver supply voltage drops momentarily, which causes the 3.3 V rail for the gate driver and MCU to sag.
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As a result, the MCU (TI F2800156) resets and fault confirmation fails.
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Gate Driver used: DRV8329-Q.
2. System Conditions
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Please refer to the attached schematic.
3. Constraints
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The MCU must sustain operation for the required hold-up time (refer to datasheet).
4. Attempted Solution
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Added ~600 µF capacitor on the 3.3 V rail, but this is not a practical solution.
Request
Could TI suggest a practical solution to prevent the MCU from resetting under this condition?
Schematic and waveform data are attached for your review.
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Input: 12 V
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POW_SUP: Node after the battery → filter → reverse polarity protection FET