Other Parts Discussed in Thread: DRV832X, CSD18542KTT, CSD19532KTT, DRV8320
I have implemented a motor drive initially with a DRV8320S and migrated to a DRV8350S due to hardware failures. In testing the DRV8350 design I have had my first failure where a gate drive has a much lower impedance to ground as compared to the other two gate drives. The CPUV (charge pump under voltage) and a VGS fault bit get set whenever I try to use the driver.
In the design with the DRV8320S we found the protection offered by the VDS_LVL to be insufficient for overcurrent protection given the large variance of Rdson over gate voltage and temperature. We were having failures where the fets would get shorted in all different manners, gate to drain, gate to source, source to drain and all three terminals shorted. Additionally the gate drivers in the DRV would fail shorted (or low impedance) to ground. To resolve the issue we added a safety circuit that monitors the total lowside current coming from all lowside FET sources and if tripped sets all INL signals low. This circuit also protects against the issue described in [1] where the chip starts up in 6x mode with unknown/wrong INL and INH values. We also migrated to the DRV8350S to increase our maximum voltage figuring the part would be more robust against voltage spikes.
Given that we have just had another failure on the bench with the DRV8350S with the safety circuit and higher voltage part we are looking for potential causes. What could cause a gate drive in the DRV83xx chip to fail? We were testing the external overcurrent safety circuit when the driver failed. The drive is configured in 3x mode and there is a fixed 2/3 duty cycle on phase A and 1/3 duty cycle on B and C which allows the current to grow quickly. The overcurrent safety circuit properly tripped and the next reset of the DRV we found the gate driver broken for phase A. One possible fault could have been our IDRIVE settings as mentioned in [2]. I had just been increasing the values and set the to a value below where I could see ringing on the gates or phase A connection point. We did successfully run the test at lower IDRIVE settings without the part becoming damaged. Is there a way to determine save IDRIVE and TDRIVE settings? Should TDRIVE or IDRIVE be prioritized first when adjusting gate drive characteristics?