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BQ26100: BQ26100 program encryption program failed

Part Number: BQ26100

dear

 .

200pcs of encryption program failure test passed, and 17pcs of encryption was found to be defective in retest  

12 PCS  BQ26100 replaced  new one, and  burning procedure is OK  

2.    5pcs reburning procedure become OK  attachment is about BQ26100 SCH

any  advise ?thanks in advance

 

  • Hi Raymond,

    You are likely familiar with the device if supporting programming.

    Common problems are apparently:

    1. Timing which should be good if it is a known system which has been in use.  Check for wear of course or contact.
    2. Power, the device is commonly powered by the I/O (SDQ) line.  Your schematic shows "3V3" on the PWR pin, I'm not sure if this is applied or sourced from the I/O line.  Check:
      1. Contact wear or contamination
      2. Be sure the 3V3 does not load the power from I/O
      3. Check capacitor tolerance if powered by the I/O
    3. OTP programming requires an applied power, see figure 25 of the BQ26100 data sheet.  The schematic appears setup for this but does not show a test point on the I/O line for the programming voltage.  If this is the programming type issue again be sure the 3V3 is not loading the power needed for programming.  Applied power is recommended to be through a diode as shown in figure 20 of the data sheet so it does not load that applied at I/O.