TPS563249: DUT stop function in a sudden, and find out TPS563249DDCR output short to GND

yee tat chua

Prodigy 60 points

Part Number: TPS563249

Order number: T01147185

MPN: TPS563249DDCR

Issue: DUT stop function in a sudden, and find out TPS563249DDCR output short to GND

observation:

- TPS563249DDCR Input, Output, and GND pins all short together.

- resistance between these 3 pins measured as 0.1 ohm

- after replacing with a new TPS563249DDCR, DUT able to function as normal.

Request: Can TI perform a failure analysis on the damage IC to find out the cause of damage?

over 4 years ago

0 Edwin Zang over 4 years ago

TI__Expert 6425 points

Hi Friend,

Could you share schematic and layout to review? Could you describe in detail when the part damage what items is testing?

please contact CQE to do FA.

BRs,

Edwin.

0 yee tat chua over 4 years ago in reply to Edwin Zang

Prodigy 60 points

0 yee tat chua over 4 years ago in reply to Edwin Zang

Prodigy 60 points

How or where can i contact CQE to do FA?

0 Edwin Zang over 4 years ago in reply to yee tat chua

TI__Expert 6425 points

Hi Chua,

schematic and layout look well. By the way, how many sample do you find failure? do it fail in production or making experiences?

please contact supporting your sales and FAE. they will help you contact CQE.

BRs,

Edwin.

0 yee tat chua over 4 years ago in reply to Edwin Zang

Prodigy 60 points

We build 30 over boards through proper SMT process, only 1 facing this issue during the SQ functional test.

0 yee tat chua over 4 years ago in reply to Edwin Zang

Prodigy 60 points

We build 30 over boards through proper SMT process, only 1 facing this issue during the SQ functional test.

0 Edwin Zang over 4 years ago in reply to yee tat chua

TI__Expert 6425 points

hi Chua,

When the part damaged during making experience, the possible reason is that it's made by personally wrongly operated. and there is only one part damaged. even if we do FA for this sample, maybe we only find it's damaged by EOS.

could you repeat the experience to see if there is other sample damaged?

BRs,

Edwin.

0 yee tat chua over 4 years ago in reply to Edwin Zang

Prodigy 60 points

What is EOS stand for?

Yes, we been trying to duplicate the failure and even doing power on/off continuously(24hrs).

So far, the failure not happen on the same board or any other boards.

This is why we seeking FA report from TI.

To ensure either it is a design problem, original part failure or human mistake that due to ESD.

Even we do suspect ESD might be the root cause, but our end customer insist to hear the answer from TI.

0 Edwin Zang over 4 years ago in reply to yee tat chua

TI__Expert 6425 points

Hi Chua,

EOS means Electrical Overstress.

If we find the part damaged by EOS after doing FA, we still couldn't confirm the root cause is a design problem, original part failure or human mistake.

In fact we wants know the root cause of the damage. but now even if this part is sent to do FA, we still couldn't find the root cause. I think a better way is to check if we can duplicate the failure and continue to do test. it can help us confirm the bug.

BRs,

Edwin.

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TPS563249: DUT stop function in a sudden, and find out TPS563249DDCR output short to GND