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bq24610 mosfet shoot-through

Other Parts Discussed in Thread: BQ24610

We have a BQ24610 design where I believe we are seeing mosfet shoot-through.  It is mostly similar to the typical application circuit in the datasheet, 12V input, 4.2V@2A output.  The charger is functional, but we are getting very high radiated energy in our EMI scans.  We used a Fairchild FDMS7700S (dual N with schottky) which has a fairly high input capacitance/low rds(on) as we used it in a different regulator on the same board.  In the process of debugging we added gate series resistors and started to blow out the mosfets.  Looking at the gate drives on a working board there appears to be some overlap.

My question is, are there any selection guidelines about how much MOSFET input capacitance is too much, assuming the BQ24610 is driving the FET gates directly with no series R?

  • I do not have a selection guideline for the MOSFET input capacitance. Also, the gate turn-on waveform is decided by several other parameters (MOSFET interal gate resistor, the parasitic inductance around MosFET, the miller capacitance...).

    You can add a resistor paralleling with a diode to do slow turn-on and quick turn-off. Turn-on current goes through the series resistor. Turn-off current goes through the series diode.

  • Hello Sir. Can you explain me why it is better to turn of a mosfet faster than turning it on?
    Isn't back emf spike in inductor generated when mosfet is turned off rather than turned on?
    So going with that logic should not be turning on be fast and turn off smooth?

  • Hi Patryk,

    The EMI energy during turn-on is higher relative to gate resistor than the energy during turn-off. We can reduce EMI during turn-on by add bigger resistor on turn-on trace.
    And if the turn-off speed is too low, the thermal accumulate in MOSFEt and may cause the MOSFET damaged.

    Best regards,
    Ann Lien