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Original question:

CSD17318Q2: Qualification summary

CSD17318Q2: Qualification report

Danilo A.
Mastermind 28680 points
Part Number: CSD17318Q2

Hi Team,

Our customer is requesting for a more detailed qualification report for CSD17318Q2. We have shared the document from the other thread but our customer is looking for a report like the one attached below. Do we have a similar report for CSD17318Q2?

Qualification Summary_SN74LVC1G07QDCKRQ1-366330.pdf

Regards,

Danilo

  • 0
    TI__Mastermind 38200 points

    Hello Danilo,

    Thanks for promoting TI FETs at your customer. I have an inquiry into the reliability engineer to see if we have a more detailed report. Can you tell me what the customer believes the qual summary already provided is lacking in terms of details? Due to the holidays, I will not have any additional information until next week when everyone is back at work.

    Best Regards,

    John Wallace

    TI FET Applications

  • 0 in reply to John Wallace1
    TI__Mastermind 28680 points

    Hi John,

    According to our customer, he is looking for lot & sample sizes, hours completed on each test, whether or not wearout mechanisms were tested, etc.

    Regards,

    Danilo

  • 0 in reply to Danilo A.
    TI__Mastermind 38200 points

    Hi Danilo,

    I followed up with the reliability engineer. This is the only qual report we have available for the CSD17318Q2. Please ask your customer to review the report as it includes the number of lots, sample size, hour (or cycles) and failures if there were any. It's all right there in the report.

    Best Regards,

    John

  • 0 in reply to John Wallace1
    TI__Mastermind 28680 points

    Hi John,

    We have received this feedback from our customer,

    Thank you for your reply. And thank you for pointing out the obvious thing that I missed: the lot/sample/failed. For whatever reason, I misread this and did not see what was clearly presented.

    However, I'd still like to know the bias voltage conditions, and the failure mechanisms and models of interest which the tests were addressing. Do you have this information as well.

    Regards,

    Danilo

  • 0 in reply to Danilo A.
    TI__Mastermind 38200 points

    Hi Danilo,

    Bias conditions are as follows:

    • HTRB 150°C/80% rated Vdss
    • HTGB 150°C/80% rated Vgss
    • THB 85°C/85% RH/80% rated Vdss
    • IOL ΔTj = 100°C, 2min on/2 min off

    I don't have the details on failure mechanisms.

    Best Regards,

    John