Hello TI Team,
It is mentioned in 5.2.3.2 FET Control on page 33 of the manual, "device is put into FET Test mode by clearing Settings:Manufacturing:Mfg Status Init[FET_EN]."
If I want to test CHGTEST and DSGTEST, is it set to 0x06 as described in Table 5-9?
Combined with the sample code, I set BQ769x2_SetRegister(MfgStatusInit,0x06,2); is it correct?
And be able to test with the following code?
CommandSubcommands(DSGTEST);
CommandSubcommands(CHGTEST);
I use the power supply to simulate the battery, and the electronic load to simulate the load side, but sometimes there is a re-Initial.
Finally, I would like to ask if there are other protections or parameters that will affect the FET TEST MODE?
Can you help?
Thanks!
Regards,
Edgar